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XMaS featured in Materials Letters

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Salvati E,Brandt LR, Papadaki C, Zhang H, Mousavi SM, Wermeille D, Korsunsky AM, "Nanoscale structural damage due to focused ion beam milling of silicon with Ga ions"

Mater. Lett. 213, 346-349 (2018)

DOI:10.1016/j.matlet.2017.11.043

Tue 06 February 2018, 11:12 | Tags: publications, xmas BL