Multiferroic materials offer the opportunity for many new types of devices - from ultralow magnetic field sensors to new types of multiple state memories.
Much has been learnt of these materials through the use of diffraction and spectroscopy methods through synchrotron and neutron scattering combined with other methods, including bulk and thin film metrology and atomistic modelling.
The X-ray & Neutron Scattering in Multiferroics Research workshops comprise a series of one day meetings designed to bring together experts from the multiferroics, magnetoelectrics and ferroelectrics communities with neutron and synchrotron facility users to present the latest developments in this field. The meetings are co-organised by the Smart Materials & Systems Committee of the UK's Institute of Materials, Minerals and Mining, Electrosciences Ltd (Director Prof Markys G. Cain) and The XMaS Beamline (Paul Thompson).
For further information and to register for the fourth meeting, please click here.