Jeol 2200FS TEM
The Jeol 2200FS is a 200kV FEG transmission cryo-electron microscope with in-column energy filter and a top of the line Gatan K2 Summit director electron detector. It is equipped with a semi-automated data collection system for single-particle samples and tomography.
This machine is primarily used for high-resolution structural biology applications.
The Jeol 2100Plus is a 200kV LaB6 instrument fitted with a Gatan OneView IS camera. It is set up for room temperature or cryo use. This is our workhorse electron microscope and is used for routine work.
Two 3-hour training sessions are usually sufficient to use this machine independently for room-temperature TEM. For cryo-EM, the training process takes a few days.
Acknowledging our work
If the staff of the Advanced Bioimaging RTP have significantly contributed to your research, for instance in experimental design and data processing, please consider them for authorship on your publications.
- Jeol 2200FS/DiSPIM/Cryo-ultramicrotome
We acknowledge the University of Warwick Advanced Bioimaging Research Technology Platform supported by BBSRC ALERT14 award BB/M01228X/1
- Jeol 2100Plus TEM
We acknowledge the Midlands Regional Cryo-EM Facility, hosted at the Warwick Advanced Bioimaging Research Technology Platform, for use of the JEOL 2100Plus, supported by MRC award reference MC_PC_17136
Our cryo-ultramicrotome is set up for use at room temperature or cooled with liquid nitrogen. It can be used for CEMOVIS, Tokuyasu and sectioning of resin-embedded samples.
We support analysis of datasets a variety of platforms. For single images we can provide help with ImageJ/FIJI to insert scale bars and improve contrast. We can help with the reconstruction of tomograms using IMOD. We support RELION for 2D averaging and cryoEM structure determination.
We have a dedicated staining bench, cryo-transfer bench, a carbon coater, a glow discharger, and a rapidplunge-freezing device. We can do resin embedding of samples as a service and assist with preparation of biological samples for scanning electron microscopy