The Asylum Research MFP3D.
The Asylum Research MFP3D-SA is a very versatile atomic force microscope, suitable for use with a wide range of samples and features a vast array of modes.
It has a z-range of 40 um (extended head model) and an x and y movement of up to 90 um in a closed loop scan. The microscope differs from most others available on the market due to using seperate piezos for each plane. This allows for the use of nano-position sensors, minimising hysterisis and creep, whilst also ensuring flat scans.
The MFP-3D is able to image conductive, semiconductive and insulating samples in both air and liquid environments. The head can be adjusted to fit a wide range of sample sizes and both top down and bottom up illumination of samples is possible.
A heating stage (30 to 250 Celsius) is also available for use with the MFP3D, with the ability to image under a constant flow of N2.
|X & Y scan||90 um||Alternate contact, AC (tapping)||Contact mode|
|Z scan||40 um||Conductive AFM (C-AFM)||Kelvin probe microscopy (SKPM)|
|X & Y noise||< 0.5 nm||Electrostatic force microscopy(EFM)||Dual AC|
|Z noise||< 0.06 nm||Force mapping||Nano-indentation|
|More available here!||and many more, please contact us if you are after a specific mode.|
|Simultaneously captured height, UFM response, lateral and torsion and lateral amplitude.1|
|Height, frictional force microscopy and orientation map of graphene.2|
1 M. S. Skilbeck et al. Nanotechnology, 2014, 25, 335708
2 A. J. Marsden et al. Nanotechnology, 2013, 24, 255704