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Conference Programme

If you have any issues on the day, please contact one of the local chairs:

Jay Warnett 07736 949639

Alex Attridge 07887 682065

Wednesday 12th July - Pre-conference workshops

There are two pre-conference workshops on Avizo and Simpleware that will run concurrently. In the middle of the workshops there will also be a short NPL presentation on "Introduction to Measurement"

On arrival, please come to the reception of the IMC (International Manufacturing Centre) as per the location page.

09.15-09.45 Arrival and Registration
09.45-12.15 Avizo/Simpleware workshop part 1
12.15-13.00 Lunch
13.00-14.00 NPL presentation "Introduction to Measurement"
14.00-16.30

Avizo/Simpleware workshop part 2





Thursday 13th July - Conference day

Full abstracts can be found here.

Poster presentation abstracts can be found here.

09.00-10.00 Registration/Coffee
10.00-10.15 Introduction
Session 1: Acquisition and process methodologies
10.15-10.35
Limited view X-ray CT for dimensional analysis
G. Jones; Imperial College London
10.35-10.55 A versatile laminographic scanning system as an additional for an existing CT scanner
T. Blumensath; University of Southampton
10.55-11.15 A study into the use of simple holeplates to measure the apparent distortion in the geometry of reconstructed volumes
H. Corcoran; UCL/NPL
11.15-11.35 Coffee Break
Session 2: Industrial development and application
11.35-11.55 XCT measurement applications in aerospace
K. Pickup; BAE Systems
11.55-12.15 Dimensional 3D X-ray Computed Tomography at high absorbing samples
T. Mayer; GE Oil and Gas
12.15-12.35 Additional problems with CT metrology for large samples
D. Bate; Nikon
12.25-13.30 Lunch
Session 3: Applications of CT measurement
13.30-13.50 Tracking the evolution of a defect characteristic of AFP layup during cure with in-process micro-XCT scanning
L. Pickard; National Composites Centre/University of Bristol
13.50-14.10 Automated processing for 3D powder characterization
P. Gajjar; University of Manchester
14.10-14.30 A sensitivity analysis for the measurement of internal additively manufactured surfaces by X-ray Computed Tomography
A. Thompson; University of Nottingham
14.30-14.50 Detection of unmelted powder in additive manufactured components using computed tomography
A. Tawfik; University of Huddersfield
14.50-15.10 Coffee
Session 4: Accuracy and Standardisation
15.10-15.30 Operator influences on CT scanning: a round robin study
J. M. Warnett; WMG, University of Warwick
15.30-15.50 Verifying the dimensional performance of XCT systems with metrology capability
M. McCarthy; BSI/Engineering Metrology Solutions
15.50-16.20 Panel discussion
16.20-16.35 Closing remarks
16.35 Lab tour (optional)



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