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Advanced Materials 2 Multimode AFM

Veeco Multimode V

Location
Chemistry, University of Warwick (C102)
Custodian
Professor Julie Macpherson
Applications

Atomic force microscope capable of imaging in air and fluid, as well as making electrical measurements. Large scope of samples may be studied such as nanoparticles, electrode surfaces, thin films and biological samples.

Specification
      • Sub-angstrom resolution
      • Maximum scan size 150 x 150 microns
      • Z range 5 microns
      • Maximum resolution 5120 x 5120 pixels
      • Full range of standard force modes
      • Fast data capture
      • Dedicated conducting AFM module


          AM2 AFM

          JPK Instruments Nanowizard II

          Location
          Chemical Engineering, University of Birmingham (102)
          Custodian
          Professor Mike Adams
          Applications

          Atomic force microscope capable of imaging in air and fluid, as well as making electrical measurements. Large scope of samples may be studied such as nanoparticles, electrode surfaces, thin films and biological samples.

          Specification
              • Large scan field of 100 × 100 × 15 µm3
              • Range (x, y, z): 100 μm, 100 μm, 100 μm
              • Sub Ångstrom resolution
              • Dedicated conducting module
              • Cellhesion controller
              • Biocell controller
              • Petri-dish heater
              • Electrochemical cell
              • Biopotentiostat
              AFM nanowizard