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Advanced Materials 2 Ellipsometer

Nanofilm EP3-SE

Location
Chemistry, University of Warwick (C103a)
Custodian
Professor Pat Unwin
Applications
Ellipsometry may be used for the determination of film thickness, morphology, microtribology, electric and optic properties of multilayer metal/metaloxides; self assembled molecules and thin film polymeric materials; next generation energy-efficient glazings. Surface Plasmon resonance package is available for molecular surface interaction investigations.
Specification
            • Spectroscopic ellipsometer with 46 wavelengths between 365 nm to 1000 nm
            • Wavelength and angle of incidence scanning
            • Mapping function
            • Lateral resolution 1 µm
            • Surface plasmon resonance (SPR) cell  


                       AM2 ellipsometer