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Advanced Materials 2 Profilometer

KLA Tencor MicroXAM2 Interferometer/Profilomete

Location
Chemical Engineering, University of Birmingham (lab 102)
Custodian
Professor Mike Adams
Applications
Interferometry measures surface topography and wear volume through three-dimensional surface profiling. Equipment may be used to measure coating film thickness up to 60µm.
Specification
  • Vertical range up to 50 mm
  • 100 mm x 100 mm sample positioning stage
  • Phase mode for nanoscale resolution
  • Surface roughness may be quantified
  • Dissimilar materials analysis


profilometer