Please read our student and staff community guidance on COVID-19
Skip to main content Skip to navigation

Ellipsometer

The Nanofilm imaging spectroscopic ellipsometer can be used to study thin films or microarrays. Properties such as thickness and refractive index can be measured. A lateral resolution of ~2 µm is possible. Wavelengths available from 360 - 1001 nm.

Location: C103a

Main contact: Pat Unwin

Make a booking


ellipsometer

Documents(PDF document)

Quick user quide 

Principles of Ellipsometry 

EP3 data collection manual 

EP4 modelling software manual 

Modelling and dispersion functions

Electrochemical cell manual

Solid liquid cell manual

Links

Nanofilm

NanoCharM consortium: lots of useful information on ellipsometry