It is well-established that important information about the dissolution and growth of crystals can be obtained by the investigation of step movement on single-crystal faces via in situ AFM. However, a potential drawback of this approach for kinetic measurements is that the small region of investigation may not be representative of the overall surface. It is shown that the investigation of local processes without accounting for the processes outside the region of interest can lead to significant misinterpretation of the data collected. Taking the case of gypsum dissolution as an example, we critically analyze literature data and develop 3 different finite element method models that treat in detail the coupled mass transport–surface kinetic problem pertaining to dissolution processes in a typical AFM environment. It is shown that mass transport cannot be neglected when performing in situ AFM on macroscopic surfaces even with high-convection fluid cells. Moreover, crystal dissolution kinetics determined by AFM is mainly influenced by processes occurring in areas of the surface outside the region of interest. When this is recognized, and appropriate models are applied, step velocities due to dissolution are consistent with expectations based on macroscopic measurements, and the kinetic gap that is often apparent between nanoscale and macroscopic measurements is closed. This study provides a framework for the detailed analysis of AFM kinetic data that has wide utility and applicability.

The ability to make electrochemical measurements under controlled fluid flow has many applications in electrochemical analysis, especially at trace levels. With a move to rapid, on-line, small volume measurements and a need to improve measurement performance, there is a requirement to manufacture more complex fluidic systems with controlled internal 3D geometries at low cost. Both precision machining and lithography typically fail to meet these needs. In this article we describe the role of additive manufacturing (AM) for the fabrication of (micro)fluidic electrochemical flow systems. We show how AM has advanced device manufacture in these areas compared to the more traditional approaches. Different AM methods are also discussed with respect to their capabilities and advantages. A selection of current AM electrochemical flow cell applications are highlighted and future perspectives discussed.

Scanning ion conductance microscopy (SICM) is demonstrated to be a powerful technique for quantitative nanoscale surface charge mapping of living cells. Utilizing a bias modulated (BM) scheme, in which the potential between a quasi-reference counter electrode (QRCE) in an electrolyte-filled nanopipette and a QRCE in bulk solution is modulated, it is shown that both the cell topography and the surface charge present at cellular interfaces can be measured simultaneously at high spatial resolution with dynamic potential measurements. Surface charge is elucidated by probing the properties of the diffuse double layer (DDL) at the cellular interface, and the technique is sensitive at both low-ionic strength and under typical physiological (high-ionic strength) conditions. The combination of experiments that incorporate pixel-level self-referencing (calibration) with a robust theoretical model allows for the analysis of local surface charge variations across cellular interfaces, as demonstrated on two important living systems. First, charge mapping at Zea mays root hairs shows that there is a high negative surface charge at the tip of the cell. Second, it is shown that there are distinct surface charge distributions across the surface of human adipocyte cells, whose role is the storage and regulation of lipids in mammalian systems. These are new features, not previously recognized, and their implications for the functioning of these cells are highlighted.

A new method for transferring chemical vapor deposition (CVD)-grown monolayer graphene to a variety of substrates is described. The method makes use of an organic/aqueous biphasic configuration, avoiding the use of any polymeric materials that can cause severe contamination problems. The graphene-coated copper foil sample (on which graphene was grown) sits at the interface between hexane and an aqueous etching solution of ammonium persulfate to remove the copper. With the aid of an Si/SiO₂ substrate, the graphene layer is then transferred to a second hexane/water interface to remove etching products. From this new location, CVD graphene is readily transferred to arbitrary substrates, including three-dimensional architectures as represented by atomic force microscopy (AFM) tips and transmission electron microscopy (TEM) grids. Graphene produces a conformal layer on AFM tips, to the very end, allowing easy production of tips for conductive AFM imaging. Graphene transferred to copper TEM grids provides large-area, highly electron-transparent substrates for TEM imaging. These substrates can also be used as working electrodes for electrochemistry and high-resolution wetting studies. By using scanning electrochemical cell microscopy, it is possible to make electrochemical and wetting measurements at either a freestanding graphene film or a copper-supported graphene area and readily determine any differences in behavior.

Scanning electrochemical microscopy (SECM) is a powerful tool that enables quantitative measurements of fast electron transfer (ET) kinetics when coupled with modeling predictions from finite-element simulations. However, the advent of nanoscale and nanogap electrode geometries that have an intrinsically high surface area-to-solution volume ratio realizes the need for more rigorous data analysis procedures, as surface effects such as adsorption may play an important role. The oxidation of ferrocenylmethyl trimethylammonium (FcTMA⁺) at highly oriented pyrolytic graphite (HOPG) is used as a model system to demonstrate the effects of reversible reactant adsorption on the SECM response. Furthermore, the adsorption of FcTMA²⁺ species onto glass, which is often used to encapsulate ultramicroelectrodes employed in SECM, is also found to be important and affects the voltammetric tip response in a nanogap geometry. If a researcher is unaware of such effects (which may not be readily apparent in slow to moderate scan voltammetry) and analyzes SECM data assuming simple ET kinetics at the substrate and an inert insulator support around the tip, the result is the incorrect assignment of tip–substrate heights, kinetics, and thermodynamic parameters. Thus, SECM kinetic measurements, particularly in a nanogap configuration where the ET kinetics are often very fast (only just distinguishable from reversible), require that such effects are fully characterized. This is possible by expanding the number of experimental variables, including the voltammetric scan rate and concentration of redox species, among others.

Oxidation of zero-valent phosphine complexes [M(P^tBu₃)₂] (M=Pd, Pt) has been investigated in 1,2-difluorobenzene solution using cyclic voltammetry and subsequently using the ferrocenium cation as a chemical redox agent. In the case of palladium, a mononuclear paramagnetic Pd^I derivative was readily isolated from solution and fully characterized (EPR, X-ray crystallography). While in situ electrochemical measurements are consistent with initial one-electron oxidation, the heavier congener undergoes C−H bond cyclometalation and ultimately affords the 14 valence-electron Pt^II complex [Pt(κ²_PC-P^tBu₂CMe₂CH₂)(P^tBu₃)]⁺ with concomitant formation of [Pt(P^tBu₃)₂H]⁺.