XPS Capabilities

• Monochromated Al Kα X-ray photoelectron spectroscopy (XPS).
• Typical resolution = 0.47 eV.
• Typical XPS probing depth of 2-10 nm.
• Operating pressure ~ 2 x10^-11 mbar.
• Minimum probing area: 60 μm x 60 μm
• Maximum probing area: 1.75 mm x 2.75 mm
• Range of take-off angles available for more surface sensitive experiments.

• Ultraviolet photoelectron spectroscopy (UPS).
• Typical resolution = 0.2 eV, highest resolution = 0.12 eV.
• Low energy ion guns on both chambers for sample cleaning.
• Ports for evaporation cells on the adjacent preparation chamber.
• Computer-controlled sample annealing up to 850 C in both chambers.
• Fast entry chamber for sample loading and integrated in-vacuum transfer
  system, including our new three-stage sample loader.
• UHV transfer to our ARPES / LEED chamber.
• Sample carousel with 12 slots for sample storage in UHV conditions.
• Sample dimensions must be no greater than ~ 12 x 12 x 5 mm.