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The ZEISS SUPRA55VP installed in the summer of 2004 is the latest high resolution
FEGSEM for the analysis of materials and semiconductors, and with the variable pressure option the ability to look at beam sensitve and non-conducting samples. The microscope also has an EDAX EBSD system for mapping the crystal orientation of materials

zeiss supra55vp

• Resolution: 1nm @15kV / 4nm @ 0.1kV
• Accelerating Voltage 0.1 to 30kV
•5 Axes Eucentric motorised specimen stage
• Thermal field emission gun
• Variable pressure mode 2Pa to133Pa
• Digital image processing
• EDAX Genesis analytical system with thin window detector+ EBSD System
*Gatan Alto 2500 Cryotransfer system*