RTP Capabilities
Imaging Surfaces
The main techniques available for imaging surfaces include SEM, AFM and optical microscopy. For more information on these techniques click on the images below.
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Imaging Structure
Information about the structure of a material can be found using combination of TEM, STEM and diffractive imaging. For more information on these techniques, click on the images below.
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Spectroscopy
Elemental analysis can be performed on many of our microscopes. Optical spectroscopy is also available using a cathodoluminescence system. For more information on these techniques, click on the images below.
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Cross Sectioning and Sample Preparation
Cross-sectioning and TEM sample preparation is frequently performed using our FIB-SEM, providing sub-micron accuracy when location is important. We also have a well equipped preparation lab, with mechanical and ion polishing machines, sputter coaters and a plasma cleaner. For more information on these techniques, click on the images below.