EMRP Nanostrain Project

This programme is a collaboration between Europe's world-leading metrology experts, instrument scientists and global industry leaders including IBM, working together to develop innovative tools to measure strain accurately in piezoelectric materials at the nano-scale.

The ultimate goal is to drive innovation in the next generation of electronics devices.

esaProject

EVA Surface Analysis, in collaboration with the Department of Analytical Chemistry at Ghent University, has been developing a software suite to handle data sets from binary pseudo-TIFF structure found on CCD and pixel cameras to chaotic ad-hoc text formats like SPEC log files.

The programme, written in Microsoft Visual Studio languages and running on Windows OS, enables data sets from XRD, XAS or XEOL to be processed.

ADVENT

XMaS is pleased to participate in the EURAMET project ADVENT: Metrology for advanced energy-saving technology in next-generation electronics applications.

ORSO

XMaS contributes to the Open Reflectometry Standards Organisation (ORSO) in developing reflectivity metrologies.

ORSO is an open group of scientists from across the globe that are interested in improving their field through collaboration, with focus on neutron and x-ray reflectometry.

Their webpage hosts information about reflectometry that has been generated to inform the community, as well as detail on projects that are being developed within their working groups.

OpMetBat

XMaS, through the University of Liverpool, is a partner in the Joint Research Project within the European Partnership on Metrology “Operando metrology for energy storage materials” - OpMetBat, which was launched in 2022.

The project focuses on the development of new battery materials and specifically on improving the performance, lifetime, safety, and cost of energy storage technologies.