The Jeol 2000FX Transmission Electron Microscope is used for the analysis of materials
structure and composition at magnifications of over 750,000 times.

It is also used by postgraduate students as part of their final year projects.

SPECIFICATIONS
• Resolution: 0.32nm Point / 0.14nm Lattice
• Accelerating Voltage 80 to 200kV
• Eucentric goniometer sample holder
• W/LaB6 filament
• Sheet Film Camera.
• EDAX Genesis analytical system with thin window detector
*GATAN ORIUS 11 megapixel digital camera*