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Scanning Transmission Electron Microscopy (STEM)

The 2100 can be used in scanning mode, using a probe as small as 1.5 nm. Bright field (BF) and annular dark field (ADF) images can be collected simultaneously, or ADF + EELS spectra, or STEM + EDX, or even all three at once! One of the main advantages of this mode of operation is that electrons scattered through high angles are not strongly influenced by diffraction, and the strength of scattering is increases with mean atomic number Z. High-angle ADF (HAADF) STEM gives atomic number contrast images which are easy to interpret (brighter contrast = higher Z).

 haadf1.jpg

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