Steve Hindmarsh
Overview
As the technical expert for Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) and Atomic Force Microscopy (AFM) I take responsibility for managing these instruments. This includes all training and external work. I also have expertise with our Scanning Electron Microscope (SEM), Energy Dispersive X-Ray (EDX) and Cathodoluminescence (CL) systems as required.
FIB-SEM
TEM sample preparation accounts for the majority of our FIB-SEM workload. I therefore have significant experience in producing high quality site-specific samples, suitable for imaging at up to atomic-resolution or for in-situ TEM experiments.
I also perform cross-sectional SEM imaging, basic lithography and other tasks as requested. Please ask for further information on our capabilities.
We're keen to investigate opportunities for 3-dimensional imaging (FIB tomography). This technique collects a series of cross-sectional images, providing information about the structure of a material. Videos and segmented models can be produced. * If you have an interesting sample for this, we'd love to speak with you. *
AFM
The Bruker Icon AFM is an ideal workhorse machine for a busy core facility. My knowledge leans towards topography, roughness and nano-mechanical measurements. However, we have researchers performing electrical, piezoelectric, friction measurements, and more within our user base. I'd be pleased to put you in touch with the appropriate expert.
Background
I joined Warwick in 2011 as a trainee technician, bringing skills from my undergraduate Product Design degree (Bournemouth University) and several years working as a Measured Building Surveyor (CPB Surveys). In 2014 I joined the newly formed Electron Microscopy Research Technology Platform. In 2019 I won the nationally important PAPIN prize, for the 'provision of exceptional skills and expertise in a central research facility'. I completed an MSc by Research in 2022, supervised by Prof Richard Beanland. This project focused on the premature failure of III-V semiconductor laser diodes, specifically the growth of dislocation networks through the active region of the device.
Steve Hindmarsh
Technical Support Specialist
Office: MAS 1.06Link opens in a new window
Telephone: 02476 523 391
Email:
Postal address:
Department of Physics Stores,
University of Warwick,
Coventry,
CV4 7AL