Bruker Dimension Icon

Information

The Bruker Dimension Icon is a highly versatile Atomic Force Microscope (AFM), suitable for use with a wide range of samples, and featuring a vast array of modes. In particular, ScanAsyst allows users with limited knowledge to quickly collect high quality images and data, acquired using PeakForce tapping.

Various modes allow for topographic, electrical and mechanical measurements to be taken, often simultaneously.

A motorised stage combined with powerful AutoMET software allows for automated nanoscale measurements at user defined locations.

Comparison to SEM

What are the advantages over Scanning Electron Microscopy (SEM)?

• AFM can produce images with scan sizes ranging from ~200nm up to 100um.
• AFM collects high-resolution images containing height data at each pixel, allowing surface topography and roughness to be measured.
• Topographical, plus nanomechanical or nanoelectrical properties can be measured simultaneously
• Unlike SEM, there is no requirement for a sample to be conductive or suitable for vacuum.
• Samples can be scanned in liquid environments.

What are the disadvantages?

• Scan sizes are small compared to SEM, with maximum scan size of 100um vs ~2mm.
• Samples must be flat, with a maximum roughness well below 10um.
• Steep edges or overhangs cannot be measured.
• Scan times are much slower than SEM.