The EM RTP and the Electron Microscopy Group at Physics own a wide range of in-situ TEM holders. All of them are compatible with JEOL microscopes. We welcome enquires about potential research collaborations and commecial services.
For general enquires, please contact Professor Peng Wang or Dr Yisong Han. For the use of a specific holder, please contact the corresponding principal investigator listed below each holder.
Double tilt and low background for EDX analysis.
Accommodates standard 3 mm TEM samples.
Double tilt holder based on a tantalum furnace, with a maximum temperature up to 1000°C.
This heating holder is ideal for studying phase transitions at high temperatures using diffraction contrast imaging and electron diffraction.
Double tilt, cooled using liquid nitrogen, with a minimum temperature lower than -170°.
Similar to the Gatan 652 heating holder, ideal for studying phase transitions at low temperatures using diffraction contrast imaging and electron diffraction. Can also be used to reduce beam damage when imaging beam senstive materials.
Double tilt holder able to heat samples up to 1300°C and/or electrical bias ±150 V.
Uses specialised silicon nitride MEMS chips to hold samples with homogenous distribution of heat and high stability for atomic resolution imaging.
Can be used with point electronic GMBH scan generator on the JEOL ARM200f for electron beam induced current (EBIC) measurements of electric field and carrier dynamics in semiconductors.
Can also be used to flip the polarisation state of ferroelectrics by applying a coercive field.
An in-situ liquid phase electrochemistry system is created within a nano-reaction chamber using MEMS chips.
Atomic resolution imaging is achieved using liquid cells defined by ultra-thin (10 nm) silicon nitride windows, which also support biasing and heating functionalities.
Shiyuan Zhou, Jie Shi, et al, Nature 621, 75–81 (2023)
Designed for advanced materials research under extreme conditions. Enables new insights into material behavior at high temperatures and under low forces. Supports high-temperature compression, stretching, and biasing experiments.
World’s first strain system with nanonewton load capability at temperatures up to 1000°C and a high-precision force sensor with a resolution of less than 10 nN.
Includes a heating chip with a temperature range from room temperature to 1000°C with a 0.1°C accuracy.
Includes a three-axis dual-channel control for fast coarse/fine alignment in TEM.
