Information

The JEOL 2100plus is an analytical transmission electron microscope (TEM). It is straightforward to use and all new TEM users in the RTP begin on this instrument.

It remains the best machine for low magnifications (<20,000x) and also gives great diffraction contrast imaging with a small objective aperture.

Electron diffraction patterns (including high dynamic range patterns) can also be obtained.

Specification

• Resolution: 0.32 nm Point / 0.14 nm Lattice

• Accelerating Voltage 80 to 200kV

• Eucentric goniometer, single and double tilt sample holder, LaB₆ filament

• Oxford Instruments Aztec EDX system

• Gatan Orius 11 megapixel digital camera

Example Images

Self-assemblies prepared by RAFT dispersion polymerization.1

Characterisation of graphene oxide

(a) TEM image of a single GO sheet on a lacey carbon support; a double fold is visible in the top right corner. (b) SAED of the centre of the region shown in (a), the diffraction spots are labeled with Miller-Bravais indices. (c) Intensity profile through the diffraction spots labeled in (b). (d) TEM image with two overlapping GO sheets; a SAED pattern from the double sheet region (lower left side) is given in (e). (f) Electron diffraction pattern from a thin film of GO ca. 15 - 20 layers thick.2

Reference Publications

1 Y. Kang et al., Polymer Chemistry, 2015, 6, 106.

2 N. Wilson et al., ACS Nano, 2009, 3, 2457