Information

The Asylum Research MFP3D-SA is a very versatile atomic force microscope, suitable for use with a wide range of samples and features a vast array of modes.

It has a z-range of 40 um (extended head model) and an x and y movement of up to 90 um in a closed loop scan. The microscope differs from most others available on the market due to using seperate piezos for each plane. This allows for the use of nano-position sensors, minimising hysterisis and creep, whilst also ensuring flat scans.

The MFP-3D is able to image conductive, semiconductive and insulating samples in both air and liquid environments. The head can be adjusted to fit a wide range of sample sizes and both top down and bottom up illumination of samples is possible.

A heating stage (30 to 250 Celsius) is also available for use with the MFP3D, with the ability to image under a constant flow of N2.

Specification

• X & Y scan - 90 um
• Z scan - 40 um
• X & Y noise - < 0.5 nm
• Z noise - < 0.06 nm
• More info here!

Capabilities (modes)

• Alternate contact, AC (tapping)
• Contact mode
• Conductive AFM (C-AFM)
• Kelvin probe microscopy (SKPM)
• Electrostatic force microscopy(EFM)
• Dual AC
• Force mapping
• Nano-indentation

Example Images

Simultaneously captured height, UFM response, lateral and torsion and lateral amplitude.¹

Height, frictional force microscopy and orientation map of graphene.²

Reference Publications

 ¹ M. S. Skilbeck et al. Nanotechnology, 2014, 25, 335708

² A. J. Marsden et al. Nanotechnology, 2013, 24, 255704