The Zeiss SUPRA 55-VP is a scanning electron microscope (SEM) with a field emission electron gun (FEG). This is the brightest type of electron source and gives the highest beam current and resolution capability.
The SUPRA is able to handle a wide variety of samples, from the conducting and semiconducting materials, to large, beam sensitive or non-conducting samples. It has a resolution of 1-4nm and secondary electron, backscattered and in-lens imaging modes. It can work at accelerating volutages from 100V to 30kV. Measurements can also be taken under a variable pressure.
The system has an EDAX energy-dispersive X-ray (EDX) spectrometer that allows elemental composition analysis with a detection limit of approx. 0.5 at.%, as well as an electron backscattered diffraction (EBSD) system, used for mapping the orientation of crystalline microstructures.
Finally a cryo transfer system and stage is available to allow low temperature measurements and imaging of materials that are unstable in vacuum at room temperature such as liquids and gels.