Yisong Han

BEng MSc PhD FHEA PgCHEP

Technical Support Specialist (Senior Scientific Officer)
Electron Microscopy Research Technology Platform (EM RTP)

BEng - Sichuan University, China
MSc - University of Manchester
PhD - University of Nottingham

Background

I provide advanced scientific and technical support for the transmission electron microscopes (TEM) at the EM RTP, including the double aberration-corrected JEOL ARM200F. My expertise in TEM has enabled me to collaborate with researchers across all STEM departments within the University and beyond.

After completing my PhD at Nottingham and before joining Warwick, I worked as a dedicated TEM microscopist at several institutions, including Sheffield, Birmingham, and Cambridge. I gained extensive experience in developing and applying advanced TEM-related techniques—such as quantitative STEM imaging, electron diffraction, diffraction contrast imaging, energy-dispersive X-ray spectroscopy (EDX), and electron energy-loss spectroscopy (EELS)—for the characterization of a variety of materials, including electroceramics, size-selected metallic nanoclusters, and semiconductor thin films.

Research

coming soon ...