The X-ray Diffraction RTP is located on the 3^rd floor of the Materials & Analytical Science (MAS) building and is well equipped for the study of the structure of a wide variety of materials including single-crystals, epitaxial thin-films, polycrystalline layers, ceramics and powders under both ambient and non-ambient conditions. The suite currently houses 14 instruments including six X-ray powder diffractometers; two high resolution X-ray diffractometers; two single-crystal diffractometers for small molecule structural solution; a powerful 4kW Wavelength Dispersive X-ray Fluorescence (XRF) system for elemental analysis from B - U; a laboratory XAFS instrument; and a dedicated Small Angle X-ray Scattering system (SAXS) for measurements of polymers and other nanomaterials in a variety of sample forms, included liquid dispersed nanoparticles, gels, powders and thin films (GISAXS).

The X-ray suite is available for contract work by industrial users at competitive rates. A wide range of services are available, including powder diffraction for phase identification, structural determination, accurate lattice parameter determination, in-situ diffraction, stress & texture measurements, SAXS, XRF, single-crystal structural solution and more. A variety of forms of sample can be accommodated from large single crystals, liquid dispersed nano-particles, thin-films, and solids to ceramics and powders.