High resolution X-ray diffraction is an important technique for studying individual Bragg peaks of single-crystal and thin-film materials. High resolution and intensity is achieved using very high quality mirror and monochromator combinations. Typical routine applications of high-resolution XRD include reflectivity measurments, rocking curves and reciprocal space mapping. This allows for the precise measurement of layer thicknesses, layer composition analysis and diffuse scatter measurements to be performed. In addition, the diffractometers can be reequipped to allow stress and texture measurements to be undertaken.
Panalytical X'Pert Pro MRD
The high resolution X-ray facility consists of two Panalytical X'Pert Pro MRDs. In their standard configuration, the X'pert Pro MRDs are both equipped with a Cu Kα1 hybrid monochromator as the incident beam optics and a recieving slit / analyser crystal in the diffracted beam optics. This offers the best combination of counts to resolution for most routine applications. However, the optics can be interchanged relatively quickly to tailor the diffractometer to the application required. For the highest resolution measurements, a mirror & monochromator combination can be used, whilst for reflectivity a parallel plate collimator is available on the diffracted beam optics enabling higher angles to be reached.
The newest of our two MRDs is supported under the AWM Advanced Materials 1 project. It has a PiXcelLink opens in a new window detector enabling better counting statistics, eliminating the need for a beam attenuator and allowing the diffractometer to be used for collecting large area reciprocal space maps and powder like scans on polycrystalline samples. It is also equipped with an Anton Paar DHS 1100Link opens in a new window domed hot stage, allowing non-ambient studies on thin-films and ceramics at up to 1100C.