Facilities:

3d Optical Microscope (Bruker ContourGT)

Using Bruker's proprietary white light interferometry the Contour provides exceptional roughness and 2D/3D measurement capabilities with a wide range of applications. Vertical resolution is independent of magnification and the motorized x/y stage enables automated stitching to measure across larger areas.

• Use for 2-D / 3-D Profile measurements.

• Fast, non-contact measurement.

• Outstanding vertical resolution and range, independent of magnification.

• Stitching capability to measure larger areas.

• x/y stage 150 mm

• 640 x 480 px image size.

• Vertical resolution ~1nm

• Maximum vertical range >3 mm.

• Max lateral resolution 0.0975 μm @100x magnification (FOV 62 x 46 μm)

• Lateral resolution @2.75x magnification 3.4 μm (FOV 2.29 x 1.71 mm)

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Stylus Profiler (Bruker DekTakXT)

Stylus profiler for measuring 2-D surface profiles with 3-D measurement and analysis capabilities

• 2-D profile measurements
• 3-D capability.
• Stylus force 1 – 15 mg
• 2 μm or 0.2 μm diameter stylus
• x/y stage 150 mm
• Vertical resolution 1Å(@6.5um range)
• Maximum vertical range 1 mm
• Maximum scan length 55mm (200 mm with stitching)

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Nano Hardness Tester (Anton Paar NHT²)

Low load force indenter with nanometer depth measurement resolution for the measurement of hardness, elastic modulus, creep etc.

• • • • • • • • • • • • Use for measurement of hardness, elastic / plastic properties etc.
                      • Max load 500mN
                      • Load resolution 0.02 μN
                      • Max depth 200 μm
                      • Depth resolution 0.01 nm

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Atomic Force Microscope (Bruker Dimension Edge)

X-Y scan range 100 μm, vertical range 10 μm

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Tensile Testers (Tinius Olsen 25 ST and Hounsfield H1KS)

 

Tensile and Compressive testing with a maximum capacity of 25 KN and 1 KN respectively. For very low forces we also have a 5 N load cell for the H1KS.