Tjahjadi T, Litwin D & Yang Y-H

Optica Applicata, vol 26, no 3, 1996, 201-216

Abstract

A reflection model which enables an identification of matte, highlight and interreflection regions on objects of inhomogeneous dielectric materials is presented. The model utilises the concept of the dichromatic reflection model and the one-bounce model of mutual reflection. A phi-theta space is introduced to enable the spectral cluster of a region to be identified either as a matte hill, a highlight lobe or an interreflection lobe. An analysis of the boundary of clusters enables the use of the K-means clustering algorithm to segment the regions without the need to specify the expected number of clusters and the initial cluster centres.