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X-ray Instruments

The X-ray Diffraction RTP is located on the 3rd floor of the Materials & Analytical Science (MAS) building and is well equipped for the study of the structure of a wide variety of materials including single-crystals, epitaxial thin-films, polycrystalline layers, ceramics and powders under both ambient and non-ambient conditions. The suite currently houses 14 instruments including six X-ray powder diffractometers; two high resolution X-ray diffractometers; two single-crystal diffractometers for small molecule structural solution; a powerful 4kW Wavelength Dispersive X-ray Fluorescence (XRF) system for elemental analysis from B - U; a laboratory XAFS instrument; and a dedicated Small Angle X-ray Scattering system (SAXS) for measurements of polymers and other nanomaterials in a variety of sample forms, included liquid dispersed nanoparticles, gels, powders and thin films (GISAXS).

The X-ray suite is available for contract work by industrial users at competitive rates. A wide range of services are available, including powder diffraction for phase identification, structural determination, accurate lattice parameter determination, in-situ diffraction, stress & texture measurements, SAXS, XRF, single-crystal structural solution and more. A variety of forms of sample can be accommodated from large single crystals, liquid dispersed nano-particles, thin-films, and solids to ceramics and powders.

High Resolution X-Ray Diffraction

The high resolution X-ray facility consists of two Panalytical X'Pert Pro MRDs.

Powder X-ray Diffraction

At Warwick, we have six X-ray diffractometers for powder diffraction, covering high-throughput, high-resolution, high-temperature, low-temperature and in-site reactions.

Single-Crystal X-ray Diffraction for Structural Solution

The X-ray facility at Warwick is equipped with two state-of-the-art dual wavelength (Cu/Mo) microfocus X-ray source single-crystal diffractometers.

Small Angle X-ray Scattering (SAXS)

At Warwick, a 5m Xenocs Xeuss 2.0Link opens in a new windowLink opens in a new window instrument is installed, equipped with dual microfocus (Cu/Mo) sources, a Pilatus 300K hybrid photon counting detector and Pilutus 100K WAXS detector.

Wavelength Dispersive X-Ray Fluorescence

For elemental analysis, we are equipped with a Rigaku Primus IV Wavelength Dispersive X-Ray Fluorescence Spectrometer (WDXRF).


For studying the chemical enviroment of a material, we have a Laboratory EasyXAFS 300+ instrument for XAFS and XES measurments.