XAFS

The easyXAFS300+Link opens in a new window is a dual X-ray absorption (XAS) and emission (XES) spectrometer that can be used to perform element-specific bulk electronic structure characterisation that complements crystallographic structure studies using diffraction techniques.

The instrument works optimally between 5–12 keV, with up to 20 keV accessible with reduced throughput – making it suitable to probe K-edges of 3d transition metals as well as L-edges of some heavier elements. With flexible sample stages including an 8-slot sample-wheel, rapid collection of high-quality XAS data on standard pelletised and electrode samples are possible. XES measurements, ideal for dilute samples, provide complementary information about the electronic structure to that of XAS.