Professor Xianping Liu - Books and Chapters

• Cai, Kunhai, He, Xianbin, Tian, Yanling, Liu, Xianping, Cui, Liangyu, 2018. Development and testing of a XYZ scanner for atomic force microscope. In Eskola, Hannu; Väisänen, Outi; Viik, Jari; Hyttinen, Jari (eds.), EMBEC & NBC 2017, Singapore, Springer, pp. 326-329