Metrology
In addition to the fabrication capabilities, the cleanroom is also equipped with a suite of measurement and characterisation tools.
- Polylite optical microscopy with image capture and measurement.
- Rudolph Inc ellipsometer for transparent film refractive index and thickness measurements.
- Ambios XP100 stylus profiler.
- Wentworth probe station with Agilent B1500A parameter analyser.
- SemiProbe semi-automated probe station with Keysight B1505A power device analyser.
- Materials Development Corp (MDC) CV mercury probe station.
- Four point probe station.
Probe station
Profiler