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X-ray Reflectivity

 X-ray reflectvity uses total external reflection from surfaces and interfaces. It is useful for layer thickness between 5 and 350 Angstrom. It can give accurate layer thickness, density and roughness.  X-ray reflectvity measurements can be performed using a conventional power diffractometer [1].

XRR Scan of Thin ge Film on SI Substrate

xrr scan


The postions of the fringes are related to the film thickness by the modified bragg equation [1]


xrr formula


[1] Thin-film thickness and density determination from X-ray reflectivity data using a conventional power diffractometer HUANG T. C. ; GILLES R. ; WILL G. ;