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Dr. Richard Morris

Short Biography

My area of expertise is within nano‑scale material development and its characterisation. I obtained my PhD from the University of Warwick, working on the optimisation of Ge channel heterostuctures to enhance the hole mobility for CMOS technology.

In 2002 I secured a permanent Research Fellowship position and aligned my research interests to that of the Analytical Science Projects (ASP) group. This enabled me to work exclusively on the application of secondary ion mass spectrometry (SIMS) at ultra low energies, developing new protocols for the analysis of various materials. I was promoted to Senior Research Fellow in 2013.

In 2015 I was awarded a Marie Curie independent fellowship and moved to imec (Belgium) in order to undertake this research. The focus of this Fellowship research is Atom Probe analysis and its application to modern semiconductor materials.

From my research, numerous journal publications and conference presentations have arisen. Further details can be found from my publications.

I am a member of the Institute of Physics (IOP) and hold Chartered Physicist status. I also serve on the IOPs Materials and Characterisation group committee, previously holding the position of Honourable group secretary.

Selected Publications

Below are a selection of publications covering my research activities. A full list of my publications can be found here: Publications list.

  • R.J.H. Morris, M.G. Dowsett, R. Beanland, A. Dobbie, M. Myronov & D.R. Leadley. Analytical Chemistry, 84, 2292-2298, (2012). "Overcoming Low Ge Ionization and Erosion Rate Variation for Quantitiative Ultralow Energy Secondary Ion Mass Spectrometry Depth Profiles of Si1-xGex/Ge Quantum Well Structures". DOI: 10.1021/ac202929x
  • R.J.H. Morris, S. Fearn, J.M. Perkins, J. Kilner, M.G. Dowsett, M.D Biegalski & C.M. Rouleau. Surface and Interface Analysis, 43, 635‑638, (2011). “The use of low energy SIMS (LE‑SIMS) for nanoscale fuel cell material development”. DOI: 10.1002/sia.3526
  • Robert M. Cook, Lara-Jane Pegg, Sophie L. Kinnear, Oliver S. Hutter, Richard J.H. Morris & Ross A. Hatton. Advanced Energy Materials, 1, 440-447, (2011). “An Electrode Design Rule for Organic Photovoltaics Elucidated using molecular Nanolayers”. DOI: 10.1002/aenm.201100027
  •  J. Lui, R.J. Chater, R.J.H. Morris & S. J. Skinner. Solid State Ionics, 189, 39-44, (2011). “Oxygen surface exchange and diffusion studies of La2Mo2O9 in different exchange atmospheres”. DOI: 10.1016/j.ssi.2011.02.018

  •  R.J.H. Morris, M.G. Dowsett, R. Beanland, P.J Parbrook & C.F. McConville. Rapid Communications in Mass Spectrometry. 24, 2122‑2126, (2010). “Optical conductivity enhancement (OCE) for accurate ultra low energy SIMS analysis of wide bandgap GaN/InxGaN1‑x structures”. DOI: 10.1002/rcm.4623

  •  J.M. Perkins, S. Fearn, S.N. Cook, R. Srinivasan, C.M. Rouleau, H.M. Christen, G.D. West, R.J.H. Morris, H.L. Fraser, S. J. Skinner, J.A. Kilner & D.W. McComb. Advanced Functional Materials, 20, 2664‑2674, (2010). “Anomalous oxidation states in oxide multilayers for fuel cell applications”. DOI: 10.1002/adfm.201000279

  •  R.J.H. Morris & M.G. Dowsett. Journal of Applied Physics, 105, pp 114316. (2009). “Ion yields and erosion rates for Si1‑xGex (0≤ x ≤1) ultra low energy O2+ SIMS in the energy range 0.25-1 keV”. DOI: 10.1063/1.3139279

  •  R.J.H Morris, M.G Dowsett, S.H Dalal, D.L Baptista, K.B.K Teo & W.I Milne. Surface and Interface Analysis, 39, 898‑901, (2007). “Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis”. DOI: 10.1002/sia.2610

  •  R.J.H Morris, D.R Leadley, R Hammond, T.J Grasby, T.W Whall & E.H.C Parker. Journal of Applied Physics, 96, 6470. (2004). “Influence of re‑growth conditions on the hole mobility in strained Ge heterostructures produced by hybrid‑epitaxy”. DOI: 10.1063/1.1811784




Write To:

Department of Physics, University of Warwick, Coventry, CV4 7AL

Contact Details:

Office: P444
44 (0) 2476523871
44 (0)2476150897


ASP Group.

Analytical service.

Institute of Physics (IoP).

IoP Materials and characterisation group.

My Publications.