Professor David Whitehouse
Emeritus Professor
BSc(Bristol) PhD(Leicester) DSc(Warwick) FIEE, FInstProdEng MInstP FInstM & CSM Am Soc. Prec. Eng. SM Japanese Soc Proc Eng. SM Chinese Soc Prec Eng Full Member CIRP (International Prod Eng Research)
David.J.Whitehouse@warwick.ac.uk
School of Engineering, University of Warwick, Coventry, CV4 7AL, UK
Biography and Technical Output
Summary
Professor David Whitehouse is a world authority on surface and nanometrology - theoretically and practically. He has a B.Sc. in Physics, a Ph. D. in Surface Tribology, and D.Sc. in Metrology (The first D. Sc awarded by the University of Warwick) he also has an Honorary D.Sc. He has published over 250 papers on surface and nanometrology, has 23 patents and has written six books including the definitive ‘Handbook of Surface Metrology’ and ‘Handbook of Surface and Nanometrology’. Over 50% of all these publications having been written by him alone. In 2016 his publications according to Google Scholar has 6000 citations with an h index of 35 and i 10 index of 77.
Career
He completed a three-year postgraduate apprenticeship at a Wolverhampton firm making high voltage equipment after graduating with an honours degree in Physics from Bristol University in 1958. The next 20 years of his career was spent in industry including 10 years as Chief Research Engineer at Taylor Hobson Ltd, UK; the world famous ultra-precision instrument company in Leicester UK. During this time at Taylor Hobson he studied, in his own time, for a PhD which he obtained at Leicester University after 3 years in 1970. His paper, based on this PhD work was the first of his 12 papers published in the Royal Society.
After the period in industry he spent 23 years as Full Professor at the University of Warwick UK, first as Professor of Mechanical Engineering and later as Professor of Engineering Science. For the last five years he was Chief Scientist. During his time in the Department he was responsible for starting up both the Mechanical Engineering and the Production Engineering Divisions in the Department of Engineering. He has supervised more than 30 Ph.D. students and started the first degree course in the UK on ‘Design and Alternative Technology’ in 1978, derivatives of which are still running today.
In 1979 he started the first ‘Centre for Micro- engineering and Metrology’. And in 1990 he initiated the world’s first Journal of Nanotechnology published by the Institute of Physics and became its first Editor in Chief. This journal ‘Nanotechnology’ has recently celebrated its 25th Anniversary and has an impact factor of 3.82. It is published weekly and now has two million full-article downloads per year. He is also a joint Founder in 2002 of the Chinese Journal of Nanotechnology and Precision Engineering.
Currently, he is Emeritus Professor of Engineering Science at the University of Warwick UK, Consultant Professor at the University of Harbin, P R China, Visiting Professor at Tianjin, P R China and Visiting Professor at the Centre for Precision Technologies University of Huddersfield UK.
He has also been Visiting Professor at the Technical University of Norway, at Trondheim, the University of Bremen, Germany and the Technical University of Vienna in Austria.
Honours
He has lectured in 37 countries and has received many honours and prizes including the Joseph Whitworth Prize (Inst. Mech. E.), The James Clayton Prize (Inst. Mech. E.), the Commemorative Medallion for Advanced Technology; Mendeleev Institute of Metrology St Petersburg (then Leningrad), Russia), the Callendar Prize ‘For Outstanding Contribution to Metrology’ from the Institute of Measurement and Control and in 1986 given a five year Research Professor SERC Senior Fellowship.
He has three lifetime achievement honours, one in the UK: a Lifetime Achievement Award for World Class Metrology: ‘Champion of Metrology’ from the National Physical Laboratory, one from the USA: A lifetime Achievement Award for a long and distinguished career from the American Society of Precision Engineers which in the citation described Professor Whitehouse as the ‘Father of digital metrology’ and recently the ‘world class’ General Pierre Nicolau Award from the International Academy of Production Engineering (CIRP) based in Paris, conferred in 2012 for ‘Significant and Distinguished Scientific Contribution to the field of Production Engineering’. This is the first time this Award -regarded as the Premier Award in Production Engineering in the world- has been awarded to a Briton.
Affiliations
Fellow of the International Academy of Production Engineering (CIRP);Charter Member of the American Society of Precision Engineering; Fellow of the UK Institute of Physics; Fellow of the Institution of Engineering and Technology; Fellow of the Royal Society of Arts, Manufacture and Commerce.
He has been a consultant to Rolls Royce, Taylor Hobson, 3M(UK) and the Atomic Weapons Research Establishment, Aldermaston in the UK. Kodak, Unilever, General Motors, Caterpillar, and the Bardon Corporation in the USA, Toshiba in Japan and UBM in Germany, and the Ministry of Technology of Singapore. He has also been an ‘Expert Witness’ for the Ministry of Defence UK on two occasions.
TOTAL PUBLISHED OUTPUT 1965 - 2016
Books, Book Chapters and Patents
1 Whitehouse D J and Reason R E 1965 ‘Equation of meanline of surface texture found by an electric wave filter’ Rank Organisation Technical Monograph, Rank Taylor Hobson Division Leicester PDF
2 Whitehouse D J 1971 ‘The properties of random surfaces of significance in their contact’ Ph. D Thesis, Leicester University, Leicester
3 Whitehouse D J 1990 ‘Memoirs R E Reason FRS’ Monograph -Biographical memoirs of Fellows of Royal Society Vol 36. PDF
4 Whitehouse D J 1994 ‘Handbook of Surface Metrology’ Inst of Physics Pub ISBN 0-7503-0039-6 PDF
5 Whitehouse D J 1996 ‘Optical methods in surface metrology’ SPIE Milestone Series Vol129 ISBN 0-8194237-5
6 Whitehouse D J 2002 ‘Surfaces and their measurement’ (Hermes Penton Press, London) ISBN 1-9039-96015 PDF
7 Whitehouse D J 2003 ‘Handbook of Surface and Nanometrology’ (Inst of Physics Publ., Bristol) ISBN 07503-05835
8 Whitehouse D J 2011 ‘Handbook of Surface and Nanometrology Second Edition’ (CRC Press -Taylor & Francis Group, Boca Raton FL, London) ISBN 978-1-4200-8201-2 PDF
1 Whitehouse D J and Kawata K 1991 Nanotechnology’ Series advances in Nanoscale Physics (Adam Hilger, Bristol) ISBN 0-7503-0132-5
2 Whitehouse D J and Davies S T 1996 ‘Nanotechnology ‘Vol 7(Inst of Physics Pub , Bristol) ISBN 0957-4484 (no copy)
3 Jiang X and Whitehouse D J 2005 ‘Journal of Physics Conference Series ‘Vol 13 7th Int. Symp. Meas. Tech & Intell Instruments (ISMTII) (IOP PUB, Bristol) ISSN 1742-6588
4 Whitehouse D J and Jiang X 2006 Measurement Science and Technology Vol 17 No 3 (IOPP, Bristol) ISSN 0957-0233.
5 Whitehouse D J. 2013. Surfaces and their measurement Part 1 Int. J. Precision Technology, Vol 3 No. 3.
6 Whitehouse D J 2013 Surfaces and their Measurement Part 2 Int. J. Precision Technology, Vol 3 No. 4
1 Whitehouse D J 1973 Ch apter3 ‘Stylus Methods’ in ‘Characterisation of solid surfaces’ Ed Kane P F, and Larrabbe G B (Plenum Press, New York) p49-74
2 Whitehouse D J 1982 ‘Chapter7 ‘Digital Techniques’ in ‘Rough Surfaces ‘ Ed Thomas T (longman , London) p 144-165
3 Whitehouse D J 1981 Chapter 2 ‘ Surface topography and quality and its relevance to wear’ in ‘Fundamentals of Tribology’ Ed Suh N P and Saka N ( MIT Press, Cambridge Massachusetts) p 17-52
4 Whitehouse D J 1978 Chapter 9 ‘ Surface Metrology’ in ‘Technology of Machine Tools’ NBS Vol 5 (National Bureau of Standards, Washington) p 17
5 Whitehouse D J 1991 Chapter 1 ‘ Trends in Instrumentation and nano-technology’ in ‘ From Instrumentation to nano-technology’ Ed Gardner J W and Hingle H T ( Gordon and Breach, Philadelphia) p 1-18
6 Whitehouse D J 1998 Chapter 6 Nanotechnology instrumentation’ in Nanotechnology in Precision Engineering ‘ (Inst of Phys , Bristol) ? (no copy)
7 Whitehouse D J 1999 Chapter ‘Surface characterization and roughness measurement in engineering’ in Photo-mechanics Ed P K Rastogi No77/ Topics in Applied Physics (Springer,Berlin)
8 Whitehouse D J 1999 chapter 10 Tools of Nanotechnology: Nanometrology ‘ in ‘Handbook of Nanostructured Materials and Nanotechnology’-Spectroscopy and theory Ed H S Nalwa p 476-510
9 Whitehouse D J 2012 Chapter ‘Metrology past present and future with reference to optics’ in Process Chains for the replication of complex optical components Ed Brinksmeier E and Klocke Bremen Germany PDF
GB 1129962 Phase corrected filter mag- tape filed Ap.65 gr. Jan66 DJW etc (1965)
GB 1168372 Equal weight phase corrected filed Ap. 68 gr. Oct 69 DJW etc(1969)
GB 1198253 Phase corrected( tape reversal filed Nov .1967 gr. Jul. 1970
GB 1210181 Improvements relating to electric filter devices filed Ap. 68 gr. Oct 70- with RER JDB etc
GB 1257356 Roundness ref comp. filed May 69 gr. Dec. 71 DJW only (add to 933785 RER)
GB 1318701 Methods of waveform analysis –filed Jan 70 gr. May 73 with RCS
GB 1399729 Wankel stator –filed 73 gr.Ju. 75 with RCS
GB 1411655 Relating to optical diffractometers – filed Mar.73 gr. Oct 75 with JJ & EN
GB 1436721 Improvements in or relating to surface measurement –with PRB & DGC filed 74 gr. 76
GB 1525697 Surface measuring apparatus –multi-probe-filed Ap. 75 gr. Sep 78
GB 1553414 Surface metrology instrumentation –filed Oct 76 Gr. Sep 79 with HS
GB 2004061B Optical testing equipment-multi scatter– With JJ filed Sep. 78 gr. Mar79
GB 2037464B Multi point correlation filed Dec. 78, App. Pub. Jul. 80 gr. Nov 82
GB 2039050B Curvature centre – filed Jan79 App pub Jul 80 Gr. Dec. 82 with HS
USA 3543571 Compensation for phase distortion in surface profile measuring apparatus
USA 3571579 Assessing surface profiles with reason Spragg , Barr etc.
USA 3720818 DJW with RCS Av. Wav. Filed 73 gr. 73
USA 3885318 Epi-trochoid with RCS filed 73 gr.75 Surface Measuring Instrument
USA 3911257 Instrument for measuring curved surface variations with Bellwood and Chetwynd
USA 3927253 Image analyser with JJ and Eric Nightingale
USA 4077048 ‘’
USA 4084324 Evaluation of parameters, Measuring instrument
USA 4084324 Multiprobe
USA 4334282 Testing apparatus correlation filed Dec. 79
USA 4342091 Curved workpiece measurement
USA 7090458B2 Parallel link for robot – Gr. Aug. 2006 With TH, DGC
SW 590453 Partial arcs with PRB and DGC
EU 0001 178 Image analyser Europat. with J Jungles
1 Reason R E and Whitehouse D J 1965 ‘Ein Beitrag zur Bestimung der Oberflachen –Rauheit’. Werkstattstechnik vol 7 p 329-331 PDF
2 Whitehouse D J 1967-68 ‘ Improved type of wavefilter for use in surface finish measurement’ Proc Inst Mech Engrs Vol 182 pt 3K p 306-318 PDF
3 Whitehouse D J and Archard J F 1970 ‘The properties of random surfaces of significance in their contact’ Proc Roy Soc London Vol A 316 p 97-121 PDF
4 Jungles J and Whitehouse D J 1970 ‘ An investigation into the shape and dimensions of some diamond styli’ J Phys. E Vol 3 p 437-440 PDF
5 Spragg R C and Whitehouse D J 1970-71 ‘A new unified approach to surface metrology’ Proc Inst Mech Engrs, Vol 185 p 697-707 PDF
6 Whitehouse D J 1971 ‘Typology of manufactured surfaces’ Annals CIRP vol XVIV p419-431 PDF
7 Spragg R C and Whitehouse D J 1972 ‘An average wavelength parameter for surface metrology’
Trans Inst measurement and Control, vol. 5 p95-101 PDF
8 Whitehouse D J and Vanherck P 1972 ‘ Survey of reference lines in the assessment of surface texture’ Annals CIRP ,vol. 21 (2) p 267-273 PDF
9 Spragg R C and Whitehouse D J 1972 ‘ Die Mittle Wellenlange als Neuer Oberflachenkenwert’, Fertigung, Vol 1 p 3-8 PDF
10 Whitehouse D J 1973 ‘ A best fit reference line for use in partial arcs’ J. Phys E Vol 6 p 921-924. PDF
11 Whitehouse D J 1974 ‘Theoretical Analysis of Stylus Integration’ Annals CIRP Vol 23(1) p 181-186 PDF
12 Kahles J F , Field M Young R D and Whitehouse D J 1974 ‘Survey on surface roughness and surface integrity requirements’ Annals CIRP Vol 23(1) p 185-186 PDF
13 Whitehouse D J 1974 ‘The measurement and analysis of surfaces’ Tribology International Vol 7 (5) p249-259 PDF
14 Whitehouse D J, Vanherck P De Bruin W, Van Luttervelt C, 1974 ’Assessment of surface typology analysis techniques in turning ‘Annals CIRP Vol32 (2) p 265-282 PDF
15 Whitehouse D J 1975, ‘Some ultimate Limits on the measurement of surfaces using stylus techniques’ Trans Inst Measurement and Control Vol 8 April p 147-151 PDF
16 Whitehouse D J 1975 ‘M-Tijdschrift- Werktuigkunde’ Belgishe Vereniging van WerktuigkundigenVol 21 p 19-27 PDF
17 Whitehouse D J 1976 ‘ Signal- Rausch, Vebersserung Verhaltnisses in der Oberflachen Messtechnik’ IV Oberflachen Colloquium, Karl Marx Stadt, paper 5 p1-23 PDF
18 Whitehouse D J 1976 ‘The measurement and analysis of surfaces’ Proc Mat Konferencji Meyrologii M. P. , Metrologia 2, Warsaw, p249-259 Tribology 7 no 5 PDF
19 Whitehouse D J 1976 ‘Some theoretical aspects of error separation techniques in surface metrology’ J Phys E Vol9 P 531-536 PDF
20 Whitehouse D J 1976 ‘ Approximate methods of assessment of surface topography parameters ‘ Annals CIRP Vol 25 (1) p 461-465 PDF
21 Phillips M and Whitehouse D J 1977 ‘Some theoretical aspects of the measurement of curved surfaces’ J Phys E Vol 10 p 164-169 PDF
22 Stout K J ,Whitehouse D J and King T G 1977 ‘Analytical techniques in surface topography and their application to a running –in experiment ‘ Wear Vol 43 p 99-115 PDF
23 Whitehouse D J 1978 ‘ Digital measurement of peak parameters on surface profiles’ Inst Mech Engrs, J Mech Engrg Science, Vol 20 no 4 p 211-227 PDF
24 Whitehouse D J, King T G, Stout K J 1978 ‘ Surface metrology – Its relevance to marginally lubricated bearing performance’ Surface Technology Vol 6 p 259-270 No paper
25 Hamed M S Whitehouse D J and ButteryT 1978 ‘Random surface generation –an integrated approach’ Annals CIRP Vol 27 (1) p 491-497 PDF
26 Whitehouse D J 1978 ‘ Beta functions for surface typologie’ Annals CIRP Vol27 (1) p 401-497 PDF
27 Whitehouse D J and Phillips M J, 1978 ‘Discrete properties of random surfaces’ Phil Trans Roy Soc London Vol 290 no 1369 p 261-298 PDF
28 Whitehouse D J and Garratt J D 1979 ‘ Displacement transducers below 50mm –a comparative survey’ Annals CIRP Vol 28 (2) p511-518 PDF
29 Whitehouse D J 1978 Surfaces a link between surfaces and function’ Proc Inst Mech Engrs Vol 192 no 19 p 179-187 PDF
30 Whitehouse D J Krisnamurth R and Balasubramanian G 1978 ‘ Surface integrity of honed cylinders’ Annals CIRP Vol 27 p ??
31 Loukyanov I V, Whitehouse D J 1979 ‘ Evaluation of the autocorrelation functions used when investigating surface roughness’ Inst Mech. Engrs, J Mech. Engrg. Science vol. 21 (2) p 105-113 PDF
32 Whitehouse D J and Hamed M S 1979 ‘Tribology parameter prediction’ Wear Vol 57 p 323-329 PDF
33 Loukyanov I V, Whitehouse D J 1980 ‘ Local irregularities of the surface and their influence on surface roughness parameters’ Annals CIRP Vol 29 (1) p 423-428 PDF
34 Whitehouse D J and Staufert G 1980 ‘ Possibilities and limits of the assessment of random surfaces using two points of the autocorrelation function’ Annals CIRP Vol29 (1) P 429-433 PDF
35 Whitehouse D J and Phillips M J 1982 ‘ Two dimensional discrete properties of random surfaces’ Phil Trans Roy Soc Lond A Vol 305 p 441-468 PDF
36 Whitehouse D J 1983 ‘ Some theoretical aspects of a practical measurement problem in plateau honing ‘ Inst Prod Engng, J prod Engng Research Vol 21 (2) P 215-221 PDF
37 Whitehouse D J 1982 ‘ The parameter rash –is there a cure? Wear 83 P 75-78 PDF
38 Whitehouse D J 1983 ‘An easy to measure average peak-valley parameter for surface finish’ Proc Inst Mech. Engrs. Vol 197 C P 205-207 PDF
39 Raja J and Whitehouse D J 1984 ‘An investigation into the possibility of using surface profiles for machine tool surveillance ‘ Int. Journal Prod Engng Research Vol 22 (3) P 453-466 PDF
40 Whitehouse D J and Phillips M J 1985 ‘Sampling in a two dimensional plane’ J Phys A Maths & General, Vol 18, P 2465-2477 PDF.
41 Whitehouse D J 1987 ‘Optical and non- contact methods’ Jap Soc. Prec. Eng Vol 53 (9) P 22-27 ( in Japanese) PDF
42 Whitehouse D J 1983 ‘The generation of two dimensional surfaces having a specified function ‘ Annals CIRP Vol 32 (1) P 495-498 1983 PDF
43 Raja J and Whitehouse D J 1983 ‘Field testing of machine tool diagnostic using surface metrology’ Annals CIRP Vol 31 (1) P 503-506 PDF
44 Whitehouse D J 1983 ‘ An aspect of errors introduced into the measurement form due to miniaturisation’ J Phys E Vol 16 P 1076-1080 PDF
45 Raja J and Whitehouse D J 1983 ‘ Application of complex demodulation techniques to surface analysis’ Prec. Eng 014/83/010017 P 17-21 PDF
46 Whitehouse D J 1985 ‘ Control and instrumentation – the changing scene’ Institution of Measurement and Control , Harrogate Nov P 16-19 -ve ?
47 Whitehouse D J 1985 ‘ Instrumentation for measuring finish defects and gloss ‘ SPIE Vol 525 ‘Measurement of surface defects and quality of polish’ P 106-123 PDF
48 Whitehouse D J , D K Bowen Chetwynd D G and Davies S T 1985 ‘Nano-calibration of surfaces’ Jap Soc Prec Engrg Vol 51 (9) P 1663 (In Japanese) PDF
49 English version of 48 -ve ?
50 Whitehouse D J 1985 ‘Assessment of surface finish profiles produced by multi-process manufacture Proc Inst Mech. Engrs Vol 199 NB4 P 263-270 PDF
51 Whitehouse D J 1987 ‘ Nature of interaction of surfaces with stylus and non-contact methods of measurement’ Proc Jap Soc Pres Engrs Vol 62 P 189-190 PDF
52 Whitehouse D J 1987 ‘Surface metrology instrumentation J Phys E Sci Inst Vol 20 P 1145-1155 PDF
53 Whitehouse D J 1987 ‘ A view of metrology training in manufacturing industry’ Trans Inst Measurement and Control Vol 19 (3) P 116-122 PDF
54 Whitehouse D J 1987 Radial deviation gauge ‘ Prec Eng Vol 9 (4) p 201-210 PDF
55 Davies S T and Whitehouse D J 1987 ‘Computer controlled ion beam machining for precision surface finishing and figuring’ SPIE Vol 803 Paper no4 The Hague PDF
56 Davies S T and Whitehouse D J 1987 ‘ Micromachining with optical other submicrometre dimensional and surface specification SPIE Vol 803 p 37-42 No paper copy
57 Whitehouse D J 1988 ‘ A revised philosophy of surface measuring systems’ Proc Inst Mech. Engrs Vol 202 No C3 p 169-185 PDF
58 Whitehouse D J 1982 Surface texture assessment errors caused by skid distortion’ J Phys E Vol 15 P 1337-1340 PDF
59 Whitehouse D J Bowen Dk Chetwynd D G and Davies S T 1988 ‘ Nano-calibration of stylus based instruments’ J Phys E Vol 21 P 46-51 PDF
60 Whitehouse D J 1988 ‘ Friction and surface measurement’ Surface Topography Vol 1 P 427-438 PDF
61 Whitehouse D J 1988 ‘ Micromechanic und Mestechnik ‘ Technische Rundschau TR 18 April P 16-26 ( in German) PDF
62 Whitehouse D J 1988 ‘ Comparison between stylus and optical methods for measuring surfaces’ Annals CIRP Vol 37 (2) p 649-653 PDF
63 Whitehouse D J 1990 ‘ Memoirs R E Reason FRS’ Biographical memoirs of Fellows of Royal Society Vol 36 P 437-462 PDF
64 Li M, Phillips M J and Whitehouse D J ‘ Extension of two Dimensional sampling theory’ J Phys A Maths and General Vol 22 P 5053-5063 PDF
65 Whitehouse D J 1991 ‘ Micromechanics in systems’ Mechatronics Vol 1 (4) p 427-437 PDF
66 Whitehouse D J 1991 ‘ Nanotechnology Instrumentation’ Proc Measurement and Control Vol 24 p 37-46 PDF
67 Whitehouse D J 1990 ‘ Dynamic aspects of scanning surface instruments and microscopes’ Journal of Physics Nanotechnology Vol 1 p 93-102 PDF
68 Zheng K and Whitehouse D J 1991 ‘ The application of the Wigner distribution function to machine tool monitoring’ Proc Inst Mech. Engrs Vol 206 p 249-264 PDF
69 Whitehouse D J and Zheng K 1991 ‘The use of space frequency in machine tool monitoring’ J Inst Phys Meas. Sci. Technol. Vol 3 p 796-808 Vol3 p 796-808 PDF
70 Whitehouse D J 1993 ‘ A philosophy of linking manufacture to function – an example in optics’ Proc Inst Mech. Engrs Vol 207 P 31-42 PDF.
71 Whitehouse D J 1993 ‘ Manufacture to function in optics’ Annals CIRP Vol 42 (1) p 641-650 PDF
72 Shurmer H V and Whitehouse D J 1993 ‘ The characterisation of volatile molecular substances’ Proc Roy Soc London series A Vol 443 P 313-332 PDF
73 Whitehouse D J 1993 ‘ Trends in instrumentation for roughness and form measurement’ SPIE Vol 2088 P1-17 PDF
74 Whitehouse D J 1993 ‘ Horns of Metrology’ Quality Today Nov p22-23 PDF
75 Whitehouse D J Bowen D K , Venkatesh V C Brown C A and Lonardo P 1994 ‘ Gloss and surface topography’ Annals CIRP Vol 43 (2) p 541-549 PDF
76 Whitehouse D J 1996 ‘Enhancement of machine and instrument dynamics’ Nanotechnology Vol 7 p 47-51 PDF
77 Whitehouse D J 1994 ‘ Relationship between quality and measurement’ 7th ICPE/ $th ICHT on Measurement Chiba Japan, Jap Soc. Prec. Engrs, Vol 11 p 77-93 PDF
78 Wang W L and Whitehouse D J 1995 ‘ Method for setting Fidelity criteria for surface measuring instruments ‘ Prec. . Eng Vol 17 P 274-280 PDF
79 Wang W L and Whitehouse D J 1995 ‘Application of neural networks to the reconstruction of scanning probe microscope images distorted by finite tip size’J Inst Phys Nanotechnology Vol 6 P 45-51 PDF
80 Whitehouse D J and Wang W L 1996 ‘ Dynamics and trackability of stylus systems’ Proc Inst Mech. Engrs Vol 220 B p 159-165 PDF
81 Wang Z, Bryanston –Cross P J and Whitehouse D J 1996 ‘ Phase difference determination by fringe pattern matching’ Optics and Laser Technology Vol 28 (6) p 417-422 PDF
82 Wang Z, Graca M S, Bryanston –Cross P J and Whitehouse D J 1996 ‘ Phase shifting image matching algorithm for displacement measuring’ Optical Engng Vol 35 (8) p2327-2332 PDF
83 Wang Z Bryanston –Cross P J and Whitehouse D J 1997 ‘ Effect of image patch size on phase determination by fringe pattern matching’ Optical Engng Vol 36 (9) 2482-2488 PDF
84 Wang Z Bryanston –Cross P J Whitehouse D J 1997 ‘ Reconstructing shadow pattern image of internal surface of a small hole and estimating surface roughness from the image’ Optical Engng Vol 36 (8) p 2210-2215 No paper copy
85 Huang T and Whitehouse D J 1997 ‘The use of graph theory to formulate the linear dynamic characteristics of rigid body systems’ Proc Roy Soc Lond A 453 p 1299- 1310 PDF
86 Whitehouse D J 1997 ‘ Surface Metrology’ J Inst Phys Meas. Sci & Technol. Vol 8 p 955-972 PDF
87 Whitehouse D J 1998 ‘ Measurement update- nanometrology’ Jap Soc Prod Engng Vol 64 (3) p 357-358 No paper copy
88 Whitehouse D J 1998 ‘ Stylus contact methods for surface metrology in the ascendency’ Inst Meas & Control Vol 31 p 48-50 PDF
89 Whitehouse D J 1998 ‘Surfaces an essential link in nanotechnology’ Nanotechnology Vol 9 p 113-117 PDF
90 Huang T Wang J S and Whitehouse D J 1998 ‘Closed form solution to position workspace of Stewart parallel manipulators’ Science in China Series E Vol 41(4) ( English) PDF
91 Huang T Wang J S and Whitehouse D J 1998 ‘ Stewart Platforms’ Science in China Series E Vol 28 (2) P 136-145 (in Chinese) PDF
92 Huang T Whitehouse D J and Wang J S 1998 ‘ Local dexterity optimal architecture and design criteria of parallel machine tools’ Annals CIRP Vol 47 (1) p 347-351 PDF
92 Whitehouse D J 1999 ‘ Some theoretical aspects of surface peak parameters’ Precision Eng Vol 23 p 94-102 PDF
93 Whitehouse D J 1999 ‘ Identification of two functionally different classes of maxima in random waveforms’ Proc Inst Mech. Engrs Vol. 213 p 303-306 PDF
94 Huang T and Whitehouse D J 1998 ‘ Cutting force formulation of taper end mills using differential geometry’ Prec. Eng Vol 23 (3) p 196-203 PDF
95 Huang T Wang J and Whitehouse D J 1999 ‘ Closed form solution to the local dexterity and isotropy of Stewart parallel manipulators’ Chinese Journal of Mechanical Engineering Vol 35 (5) p 41-46 (no copy)
96 Huang T Wang J Gosselin C M and Whitehouse D J 1999’ Determination of closed form solution to the 2-D-orientation workspace of Gough Stewart parallel manipulators’ IEEE Transactions on Robotics and Automation Vol 15 (6) p 1121-1125 PDF
97 Huang T Wang J and Whitehouse D J 1999 ‘ Closed form solution to position workspace of hexapod posed virtual axis machine tools’ Trans ASME (Mech. Design) vol 121 p 26-31 PDF
98 Huang T Wang J and Whitehouse D J 1999 ‘ Theory and methodology for the kinematic design of Gough-Stewart Platforms’ Science in China Series E Vol 42 (4) p 425-436 PDF
99 Whitehouse D J 2001 ‘ Function maps and the role of surfaces’ Int. Journal Machine tool and Manufacture Vol 41 p 1847- 1861 ISSNo890-6955 PDF
100 Whitehouse D J 2000 ‘ Stylus damage prevention Index’ Proc Inst Mech. Engrs Part C J Mech. Eng Science Vol 214 P 975-980 ISSN 0954-4062 PDF
101 Huang T Wang J Gosselin C M and Whitehouse D J 2000 ‘Kinematic synthesis of hexapods with specific orientation capability and well conditioned dexterity’ SME Journal of Manufacturing Processes Vol 2 (1) ISNN 1527-6125 PDF
102 Huang T and Whitehouse D J 2000 ‘A simple yet effective approach for error compensation of a tripod based parallel kinematic machine’ CIRP Vol 49 (1) p 285-288 ISSN 0007-8506 PDF
103 Whitehouse D J 2001 ‘ Fractal or Friction’ Wear Vol 249 p 345-353 PIL 50043-1648(01) 00535-XPDF
104 Whitehouse D J 2001 ‘Some theoretical aspects of structure functions fractal parameters and related subjects’ Proc Inst Mech. Engrs 215 (J) p 207—210 PDF
105 Huang T Xiao X Y and Whitehouse D J 2001’ Stiffness estimation of a tripod based parallel kinematic machine’ IEEE Transactions on Robotics and Automation’ Vol 18 (1) p 50-58 ISSN 1042-296X PDF
106 Huang T Zheng X J and Whitehouse D J 2001 ‘ Dimensional synthesis of spherical parallel manipulators’ Progress in Natural Science Vol 12 (1) p 60- 57 ISSN 11002-0071 No paper
107 Huang T Zhao X Y and Whitehouse D J 2001 ‘ Stiffness estimation of a parallel kinematic machine by considering the rigidity of the frame ‘Science in China Vol 44 (5) p 473-485 ISSN 1006-9321(no copy)
108 Wang J S Wang Z H Huang T and Whitehouse D J 2002 ‘ Nonlinearity for a parallel kinematic machine tool and its application to interpolation accuracy analysis’ Science in China E –Technological Sciences Vol 45 (1) p 97- 105 PDF
109 Huang T Whitehouse D J and Chetwynd D G 2002 ‘ A unified error model for tolerance design , assembly and error compensation of 3-DOF parallel kinematic machines with parallel struts’ CIRP 51 (1) p 297-301 ISSN 0007 8506 (no paper copy) PDF
110 Whitehouse D J 2002 ‘ Surface and nanometrology, Markov and fractal scale of size properties ‘ 7th Int Symposium on Laser Metrology Academ Gorodok (Science City) ,Novosibirsk, Siberia Russia (Best Paper Award) Proc SPIE Vol 4900 p 469 ISBN 0-8194-4686-6 (KN) No clear paper from SPIE
111 Whitehouse D J 2003 ‘ Characterization of surface systems’ Chinese J Nanotechnology and Precision Engng Vol 1 (1) p 62-70 PDF
112 Huang T Li M, Li Z, Chetwynd D. J and Whitehouse D J 2004 ‘ optimum kinematic design of 2 D oF parallel manipulators with well shaped workspace bounded by a specified conditioning index’ IEEE Transactions on Robotics and Automation Vol 20 (3) p 538-543 ISSN 1042-296X PDF
113 Huang T Chetwynd D C, Whitehouse D J and Wang J 2005 ‘A general and novel approach for parameter identification of 6 DOF parallel kinematic machines’ Mechanisms and machine Theory Vol 40 P 219-239 PDF
114 Whitehouse D J 2005 ‘ Kinetic kinematics of small contacting moving bodies’ Chinese Journal Nanotechnology and Precision Engineering Vol 3(2) p 81-91 PDF
115 Jiang X and Whitehouse D J 2006 ‘ Miniaturized optical measurement method for surface nanometrology CIRP Vol 55(1) p 577-580 PDF
116 Whitehouse D J 2006 ‘ Across convolution – a proposed surface system operator’ Chinese Nanotech and Prec Engng Vol 4 (3) p 167-175 PDF
117 Jiang X Scott P and Whitehouse D J 2007 ‘ Free form surface characterization –a fresh approach’ Annals CIRP Vol 56 (1) p 553-556 PDF
118 Jiang X Scott P Whitehouse D J and Blunt L 2007 ‘ Paradigm shifts in surface metrology; part I historical philosophy’ Proc Roy Soc A 463 p 2049-2070 PDF
119 Jiang X Scott P Whitehouse D J and Blunt L 2007 ‘ Paradigm shifts in surface metrology; part II the current shift ’ Proc Roy Soc A 463 p 2071-2099 PDF
120 Whitehouse D J 2006 ‘ Changing trends in surface metrology’ 6th Int Symp Instrumentation and control ( ISICT) Beijing Oct 13-15 Proc SPIE Vol 6357 p j1-7 ISBN 0-8194-6452-X No paper
121 Jiang X Scott P and Whitehouse D J 2008 ‘ Wavelets in surface metrology’ CIRP Vol 57 (1) p 555-558 PDF
122 Whitehouse D J 2008 ‘ Nanometrology’ Contemporary Physics Vol 49 (5) p 351-374 ISSN 0010-7514 PDF
123 Whitehouse D J 2009 ‘ Functional fractal analysis of surfaces’ Nanotechnology and Precision Engineering Vol 7 (2) p 142-146 PDF
124 Whitehouse D J 2009 ‘ A new look at surface metrology’ Wear Vol 266 p 560-565 PDF
125 Whitehouse D J 2011 ‘ Surface geometry miniaturization and metrology’ Roy Soc Discussion Meeting Ultra Precision Engineering -from physics to Manufacturing Phil Trans Roy Soc A
Vol 370 pp 4042-4065 PDF
126 Jiang X and Whitehouse D. J. 2011 ‘Precision Metrology’ Phil. Trans. R. Soc. A Vol. 370 PP 4154-4160 PDF
127 Whitehouse D J 2011 ‘Developments in stylus instruments for surface metrology ‘ Nanotechnology and Precision Engineering Vol 9 No 4 pp 283-290 PDF
128 Whitehouse D J 2012 ‘ Surface metrology today Complicated confusing effective ? IOP J. Phys Conf. Ser. vol 311. 01001 PDF
129 Cheung C.F., Kong L., Ren M., Whitehouse D.J., To S. 2012 ‘ Generalized form characterization of ultra-precision free form surfaces ‘ Annals CIRP Vol. 61 pp 527-530 PDF
130 Jiang X and Whitehouse D J 2012 ‘Technological shifts in surface metrology’ Annals CIRP vol 61 pp 815-836. PDF
131 Whitehouse D J 2013 ‘Theoretical enhancement of the Gaussian filtering of engineering surfaces’ Proc. R. Soc A 469 20130184 PDF
132 Whitehouse D J 2013 ‘Some issues in surface and form metrology’ Int. J. Precision Technology Vol 3 No. 3 pp 223-243 PDF
133 Shunmugam M. S. and Whitehouse D J 2013 ‘Surfaces and Surface Metrology’ Int. J. Precision Technology Vol 3 No. 4 PDF
134 D J Whitehouse 2014, Nanotechnology’s Silver Anniversary (1990-2014) – The founding Editor’s Review of 25 years of nanotechnology, ‘ Physics world’ Vol. 27 No 5, 2014 Institute of Physics. PDF
135 Cheung C F , Ren M, Kong L,& Whitehouse D J 2014 ‘ Modelling and analysis of uncertainty in the form characterizion of ultra – precision freeform surfaces on coordinate measuring machines. Ann CIRP’ Manufacturing Technology’ Vol. 63 no 1 p ? PDF
136 Da Li, Chi Fai Cheung, Mingjun Ren, David Whitehouse and Xiang Zhao 2015 ‘ Disparity pattern-based Autostereoscopic 3D metrology system for in situ measurement of micro-structured surfaces’. Opt. Lett. 40(22), pp 5271-5274 PDF
1 Whitehouse D J and Archard J F 1969 ‘The properties of random surfaces in contact’ ASME Conf on surface mechanics , Los Angeles, p36-57
2 Whitehouse D J 1972 ‘ Modern methods of assessing the quality and function of surfaces’ SME Creative Engineering , paper IQ.72-206
3 Whitehouse D J 1973 ‘Review of topography of machined surfaces’ Proc Int Conf on Surface Technology , SME , Pittsburgh, May P53-73
4 Jungles J, Goodwin E and Whitehouse D J, 1974 ‘Advances in electro-optical techniques for describing engineering surfaces ‘ Proceedings Electro-Optics Instrumentation Brighton p 324-334
5 Whitehouse D J and Jungles J, 1974 ‘ Some modern methods of evaluating surfaces’ Proceedings of Internat Conf on Prod Engineering Tokyo Vol 2 p 1-9
6 Whitehouse D J 1974 ‘Modern trends in the measurement of surfaces’ Internat Conf on Manufacturing, Inst Prod Engrs, Olympia London, October 3rd
7 King T G Stout K J and Whitehouse D J 1977 ‘Surface metrology-Its relevance in a wear environment ‘ 1st Joint Polytechnic Symposium on manufacturing engineering, Leicester Paper C1 p 1-11
8 Whitehouse D J 1974 ‘Some ultimate limits of measuring surfaces using stylus techniques ‘
Proc Jap Soc Prec. Engrs
9 Whitehouse D J 1977 ‘ The specification and measurement of surface texture and its relevance ‘ ASME Conference on Gears and Cams , Detroit ,June, paper 14(KN)
10 Whitehouse D J 1980 ‘In process surface measurement and the computer control of manufacturing process’ Int Conf System Engineering , Sept . Lanchester Polytechnic
11 Whitehouse D J 1981 ‘ Use of computers in measurement and assessment of ball bearing cross tracks and rings’ Potshipniki 81 paper 22 Moscow (In Russian)
12 Miyamoto I , Kawata K Davies S T and Whitehouse D J 1987 ‘Surface topography of a steel gauge block bombarded with Nitrogen ion beams’ Conference IPAT (Ion and Plasma Assisted Techniques). Brighton UK May
13 Whitehouse D J 1987 ‘ High precision assessment of multi-processes’ Gosstandard Conference Moscow paper no 21 (In Russian)
14 Whitehouse D J 1987 ‘ Calibration of fine surfaces’ VNIMS Conference on Calibration, Leningrad paper 30 Sept.(24p) (in Russian)
15 Whitehouse D J 1988 ‘ Developments in instrumentation for quality control surface geometry at the point of manufacture’ 32nd Conference EOQC paper 8C.3 Moscow p 649-653
16 Wang W L and Whitehouse D J 1996 ‘ Open loop control of piezo electric actuators using neural networks’ Proc Eng *th IPES Compiegne France.
17 Whitehouse D J and Graca M S 1997 ‘ Surface metrology and performance’ Proc 4th Int Colloquium Micro-und Nanotechnologie Vienna Technical University ISBN 3-901888-00-4 p 147-150(KN)
18 Whitehouse D J 1997 ‘ Condition monitoring of manufacture using surface topography’ Proc 3rd Int Conf Lamda Map, J Computational Methods Vol 14 (3) July ISBN 1-85312536-9 (KN)
19 Whitehouse D J 1998 ‘ Process and quality control using surface finish’ 6th ISMQC IMEKO Vienna ISBN 3-901888020 (KN)
20 Huang T Wang J S and 1998 ‘ Closed form solution to Stewart parallel maniplulators’ Proc ASME Biennial Conf DETC98/MECH-6001 P 32-40
21 Chang A Y and Whitehouse D J 1998 ‘Revised entropy approach to the measurement of manufacturing fidelity’ Proc 5th Joint Conf on Automatic technique, Automation 98 Taipai , P 560-571 (no copy)
22 Whitehouse D J 1998 ‘ Surface metrology and its relevance to mechatronics’ Proc 2nd Int Conf Mechatronics , Hsinchu Taiwan P 471-476 (KN)
23 Whitehouse D J 1998 ‘ Advances in metrology’ !8th all India Conference on manufacturing Technology , Calcutta , Kharagpur, p 87- 99 (KN) (no copy)
24 Whitehouse D J 1999 ‘ Characterizing the machined surface condition by appropriate parameters’ Pro 3rd Int Conf On Industrial tooling Southampton Sept P 8-31 (KN)
25 Trumpold H Hutley M Held E and Whitehouse D J 1999 ‘ Calibration of stylus instruments down to nanometric range using sinusoidal calibration standards’ 1st meeting Euspen Bremen (6p) (no copy)
26 Chang A-Y and Whitehouse D J 1999 ‘ An attributed scheme of manufacturing systems flexibility’ Proc 9th Int Conf Flexible Automation and Intelligent Manufacture’ Tilberg Netherlands June p 161-166
27 Chang A-Y and Whitehouse D J 1999 ‘ On the measurement of group flexibility’ Proc 11th Nat Conf on Automatic Science and Technology Taiwan July p 236-243 (no copy)
28 Whitehouse D J 1999 ‘ Surfaces in nanotechnology’ 4th Int Conf on Electronic Measurement and Instruments (ICEMI) Harbin Inst of Technology PR China August p 215-230 (KN)
29 Whitehouse D J 1999 ‘ Surface metrology of bearings’ Int Coop Symposium on Quality Assurance by Measurement Technology and Image Processing’ Steyr Austria vol 3 p 1-6 (KN)
30 Whitehouse D J 1999 ‘Stylus and/or optical methods for surface metrology’ Int Coop Symposium on Quality Assurance by Measurement Technology and Image Processing’ Steyr Austria vol 3 p 7-22 (KN)
31 Whitehouse D J 1999 ‘ Surface measurement fidelity using laser metrology’ Proc 4th Conf on Laser Metrology and Machine Performance’ Lamda Map Newcastle July p 267-276
32 Whitehouse D J 1999 ‘ Index of fidelity’ ‘ISIST 99’ 1st Int Symp on Science and Technology , Lyouang, PR China, August p 23-26 (KN) (no copy)
33 Whitehouse D J 2000 ‘ Surface Metrology’ Copen 2000 1st All India Conference on Precision Engineering Chennai ISBN 81-7319-351-7 p 1-24 (KN)
34 Whitehouse D J 2000 ‘Surfaces and function ‘ Feinstbearbertung. Technische Oberflachen %th Int Conf IWF Kolloquium ETH Zurich ISBN 3-901888-02-0 (KN)
35 Whitehouse D J 2000 ‘Function maps and the role of surfaces’ 8th Conf on Geometry and properties of surfaces Huddersfield April p 2-18 (KN)
36 Whitehouse D J 2000 ‘Dual function-surface metrology’ XVI IMEKO World Congress, Sept . Vienna, Proc Vol 14 P 321-334 ISBN 3-901888-03-9(KN)
37 Whitehouse D J 2000 ‘ Surface finish of dies and moulds’ Osaka Japan April ISBN 1-853126616 9KN)(no copy)
38 Whitehouse D J 2000 ‘ Surfaces-function characterization’ Euspen International Seminar Warwick Sept p 92-110 ISBN i-861940637
39 Huang T Jiang B and Whitehouse D J ‘ Determination of carriage stroke of 6-PSS parallel manipulators having the specific orientation in a prescribed workspace’ Proc IEEE Int. Conf Robotics and Automation , San Fransisco April Vol 3 P 2382-2385 (EI)
40 Whitehouse D J 2002 ‘ Theoretical aspects of surface nanometrology ‘ 2nd Int. Symposium. on Science and Technology Jinan China Aug 18-22 p 1-15 ISBN 7-5603-1768-5(KN)
41 Whitehouse D J 2003 ‘ Some topics in surface and nanometrology’ Conf Optical Metrology – Optical measurement systems, Munich Proc SPIE 5144 p 435-442(KN)
42 Whitehouse D J 2003 ‘ Machined roundness in precision engineering’ 5th Int Conf Industrial tooling, Southampton Sept 10-11 (KN)
43 Whitehouse D J 2003 ‘ Progress in nanometrology’ ICOPE Int Conf on Prec Eng., Singapore ISBN 981-04-8484-4 P xii (KN)
44 Whitehouse D J 2004 ‘ Dynamics, measurement and characteristics of small objects and features’ 3rd Int Symp on Instrumentation and Technology , Xi’an China p 17-28 (KN)
45 Whitehouse D J 2005 ‘ Precision machining ; surface and nanometrology’ ICPM 3rd Int Congress on Precision Machining , Vienna University, Oct 18-19 p 1-13 (KN)
46 Whitehouse D J 2008 ‘ Surface metrology for control of manufacture’ Proc 8th Int Conf on frontiers of Design and Manufacture Tianjin China Sept 23-26 p ?
47 Whitehouse D J 2013 ‘Changes in the Attributes and Metrology of Surface Metrology’ ASPEN 2013 Tapei, Taiwan (KN)
48 Yu Y, Whitehouse D J 2013 ‘Advanced Metrology Tools for assessing micro-optical lenses with structured surfaces’ ASPEN 2013 Taipei, Taiwan
1 Whitehouse D J 1975 ‘ Modern trends in the measurement of surfaces – surface metrology‘ Proc Seminaro Sobre Metrologia Dimesional ‘ Madrid p 1-34
2 Whitehouse D J 1975 ‘Surface texture assessment errors of finishing processes caused by skid distortion’ Seminar on metrology, University of Prague Engineering
3 Whitehouse D J 1975 ‘ Some aspects of modern instrumentation ‘ Taylor Hobson Seminar, Des Plaines, Chicago
4 Whitehouse D J 1978 ‘ Surface texture measurement’ British Gear Makers Conference London May(KN)
5 Whitehouse D J 1978 ‘ Assessment of manufactured surfaces using modern techniques ‘ Rank Organisation London Paper 1 p 1-21
6 Phillips M J and Whitehouse D J 1979 ‘Truncated random variables with application to random surfaces ‘ ISO Gosstandart Moscow Tech Note Me-1
7 Whitehouse D J and Phillips M J 1979 ‘ Three dimensional peaks determined by digital analysis’ ISO Gosstandard, Moscow Doc 2- 79
8 Whitehouse D J 1980 ‘ The application of minis and micros to surface metrology ‘ BNCS 14th Annual Tech Conf ‘ Towards Integrated Manufacture’ April- British Numerical Control Society Birmingham(KN)
9 Whitehouse D J 1982 ‘ Innovation transfer university research and industrial development’ BTR Conference, Jan, Birmingham
10 Whitehouse D J 1981 ‘ Random process analysis in surface metrology’ IEE Colloquium 17.9.81 /56 London(KN)
11 Whitehouse D J and Phillips M J 1981 ‘ The assessment of engineering surfaces using random process analysis SRC Vac School Stochastic Processes in Control Systems Warwick University March
12 Whitehouse D J 1987 ‘Surface texture and its relevance in decontaminability’ British Nuclear Fuels Symposium Risley Technical report T Me 61 (KN)
13 Whitehouse D J 1984 ‘Recent advances in measurement technology’ Conference on quality control’ University of Prague, Paper31 P 21-37
14 Whitehouse D J 1986 ‘ In process gauging for cost reduction’ Inst Prod Engrg Seminar Birmingham University paper 2 P 1-15
15 Whitehouse D J 1983 ‘ Metrology’ SERC Vacation school Chapter 12 Warwick University P 1-11
16 Whitehouse D J 1988 ‘ Present and future problems in metrology’ Ist Seminar on Nano-technology Centre for Microengineering and Metrology and Tokyo Science University(KN)
17 Whitehouse D J 1986 ‘ Surfaces in nanometrology’ ISIST Harbin P R China
18 Whitehouse D J 1986 ‘ Digital analysis of two dimensional surfaces’ InT Conf Modern production and Production Metrology, Technische Universitat, Wien, Osterreich April
19 Whitehouse D J 1991 ‘ Nanotechnology instrumentation’ Vortagsreibe Integrierte Micro Systeme und ihre Anwendungen April - Neu Tecnikum Buchs (KN)
20 Whitehouse D J and flower J O 1992 ‘Surface geometry nanometric trends in characterisation and measurement’ 3rd Bienniel Symposium on Nanotechnology Between Tokyo Science University And University of Warwick
21 Whitehouse D J 1993 ‘ Future trends for instrumentation for nanotechnology Symposium Oxford UBM Mestechnik
22 Whitehouse D J 1993’ Entwcklungstendenzen der instrumentierung fur die nanotechnology’ Seminar Nanotechnology University of Vienna Institut Fur Fertigungstechnik
23 Whitehouse D J 1994 ‘ Modern advances in instrumentation for metrology’ Dept Applied Electronics Sept , Science Univ. Tokyo
24 Whitehouse D J 1997 ‘ Surface metrology and bearings’ Chinese Inst Mech Eng Colloquium On Bearings Beijing
25 Whitehouse D J 1997 ‘ Nanotechnology’ Int Conf Nano technology and precision Instrument Development , Tshinoi, Taiwan
26 Whitehouse D J 2000 ‘ Role of surface metrology in quality control’ 6th Joint Warwick /Tokyo Science University nanotechnology Symposium Sept p 13-18 (KN)
27 Whitehouse D J 2001 ‘ Surface metrology and nanometrology’ Seminar Dept Mech Eng University of Connecticut Jan 21-24 (no copy)
28 Whitehouse D J 2001 ‘ Standardization in Metrology’ NCSL Standards of Canada Toronto April 2-6 (no copy)(KN)
29 Whitehouse D J 2001 ‘Quality control’ Seminar Jap Society of Quality Control, Tokyo Oct 21-23 (no copy)
30 Whitehouse D J 2001 ‘Surfaces and mechatronics’ Jap Mechatronics Seminar Nagoya Oct 18-20(no copy)
31 Whitehouse D J 2001 ‘ Role of Surfaces’ Metalex Conference and exhibition , Bangkok Nov 7-Theoretical aspects of Surface Nanometrology 29(no copy)
32 Whitehouse D J 2005 ‘History and future prospects in the field of measurement and instrumentation’ EPSRC Life Lectures University of Huddersfield Sept
33 Whitehouse D J 2009 ‘ Surface metrology today’ Symposium AHMT Bremen University Sept 17-19 (KN)
34 Whitehouse D J 2010 ‘Surfaces Their Properties and Measurement’ Ametek Seminar Tokyo {(in Japanese)
Externally unpublished but internally published works
1 Whitehouse D J 1967 Phase distortionless filters in surface metrology Technical Report T2 Rank Precision Industries, Leicester
2 Whitehouse D J 1967 ‘ Correlation and power spectral analysis in surface metrology’ Tech Report T4 Rank Precision Industries, Leicester (No copy)
3 Hunt R T and Whitehouse D J 1970 ‘ Measurement of micro hardness using talystep’ Tech.Report T46 , Rank precision Industries, Leicester
4 Whitehouse D J 1970 ‘ Analysis of surface topography using digital techniques’ Group ‘S’ CIRP
5 Whitehouse D J 1973 ‘ Calculation of best fit curve for spherical objects’ Tech Report T50 Rank Precision Industries , Leicester
6 Whitehouse D J 1974 ‘Computational replacement of curved datum and the measurement of Talysurf 5’ Tech Report T 52 Rank Precision Industries, Leicester
7 Whitehouse D J and Jungles J 1975 ‘Beyond the merely visual- The first diffractometer for surface measurement ’ Taylor Hobson’
8 Whitehouse D J 1974 ‘Some aspects of the measurement and analysis of surfaces’ Shell Research Colloquium, Port Merion (34p)
Films
D J Whitehouse - Eight Surface Metrology professional tutorial films for Eastman Kodak, Rochester new York USA.
