News
Silver LEAF Award
The Electronic Materials and Interfaces group has been awarded Silver in the 2023-2024 Laboratory Efficiency Assessment Framework!
New publication on muon-induced defects in silicon
"Formation and annihilation of bulk recombination-active defects induced by muon irradiation of crystalline silicon" out now in Journal of Applied Physics.
New publication on hafnium oxide passivation
"Atomic Layer Deposition of Hafnium Oxide Passivating Layers on Silicon: Impact of Precursor Selection" out now in pss RRL.