A dual-beam THz spectrometer is reported that substantially reduces the influence of systematic errors in THz time-domain spectroscopy such as those caused by variations in femtosecond laser power or the environmental temperature and humidity. Dual THz beams with single-cycle waveforms were generated simultaneously using a dual-pixel interdigitated photoconductive antenna, allowing the simultaneous acquisition of sample and reference data in the spectrometer using the same optical components. A low-aberration optical geometry ensured diffraction-limited spatial profiles for both beams despite their off-axis propagation and was validated experimentally by measuring frequency-dependent beam profiles and theoretically via physical optics calculations. Although the experimental amplitudes and absolute phase spectra of both beams were very similar, we further provided a correction procedure to eliminate these small differences. The robustness of the dual-beam spectrometer design was evaluated by measuring the complex transmission of a thin plastic sheet after intentionally introducing a change in the relative humidity of the THz beam path. The dual-beam THz spectrometer was effective at removing systematic errors in the amplitude and phase by simultaneously measuring the two THz beams under the same conditions.

In perovskite solar cells, photovoltaic action is created by charge transport layers (CTLs) either side of the light-absorbing metal halide perovskite semiconductor. Hence, the rates for desirable charge extraction and unwanted interfacial recombination at the perovskite-CTL interfaces play a critical role for device efficiency. Here, the electrical properties of perovskite-CTL bilayer heterostructures are obtained using ultrafast terahertz and optical studies of the charge carrier dynamics after pulsed photoexcitation, combined with a physical model of charge carrier transport that includes the prominent Coulombic forces that arise after selective charge extraction into a CTL, and cross-interfacial recombination. The charge extraction velocity at the interface and the ambipolar diffusion coefficient within the perovskite are determined from the experimental decay profiles for heterostructures with three of the highest-performing CTLs, namely C60, PCBM and Spiro-OMeTAD. Definitive targets for the further improvement of devices are deduced: fullerenes deliver fast electron extraction, but suffer from a large rate constant for cross-interface recombination or hole extraction. Conversely, Spiro-OMeTAD exhibits slow hole extraction but does not increase the perovskite’s surface recombination rate, likely contributing to its success in solar cell devices.

Improved knowledge of the influence of temperature upon layered perovskites is essential to enable perovskite-based devices to operate over a broad temperature range and to elucidate the impact of structural changes upon the optoelectronic properties. We examined the Ruddlesden–Popper layered perovskite 2-thiophenemethylammonium lead iodide (ThMA2PbI4) and observed a structural phase transition between a high- and a low-temperature phase at 220 K using temperature-dependent X-ray diffraction, UV–visible absorption, and photoluminescence (PL) spectroscopy. The structural phase transition altered the tilt pattern of the inorganic octahedra layer, modifying the absorption and PL spectra. Further, we found a narrow and intense additional PL peak in the low-temperature phase, which we assigned to radiative emission from a defect-bound exciton state. In both phases we determined the thermal expansion coefficient and found values similar to those of cubic 3D perovskites, i.e., larger than those of typical substrates such as glass. These results demonstrate that the organic spacer plays a critical role in controlling the temperature-dependent structural and optoelectronic properties of layered perovskites and suggests more widely that strain management strategies may be needed to fully utilize layered perovskites in device applications.

Monolayer molybdenum disulfide (1L MoS2), a promising optoelectronic material, emits strong visible photoluminescence (PL). Systematic control of the intensity, energy, and spectral width of PL from 1L MoS2 on silicon dioxide/silicon (SiO2/Si) is demonstrated via simple external treatments. Treating MoS2 with solutions formed from the superacid bis-(trifluoromethanesulfonyl)amide (TFSA) enhances, blueshifts, and sharpens the PL. Treatments with solutions from structurally analogous chemicals that lack sulfur, in the case of bis(trifluoroacetamide) (BTFA), or lack fluorine, in the case of methanesulfonamide (MSA), show the same trend, suggesting a two-component mechanism for TFSA involving the presence of electronegative species and sulfur vacancy passivation. Up to ≈100× enhancement of the PL intensity is achieved, with the peak blueshifted by ≈30 meV and the spectral linewidth halved. Conversely, direct thermal atomic layer deposition (ALD) of aluminum oxide (Al2O3) or hafnium oxide (HfO2) is found to suppress the PL by up to a factor of ≈3, redshift by up to ≈70 meV, and broaden by ≈3×. Single-spot and mapping Raman/PL techniques are combined in a robust characterization process to associate changes in the PL character to charge doping. This work demonstrates the convenient tunability of the optical behavior of 1L MoS2 by varying the electron density.