Skip to main content Skip to navigation


Two new RTP's launched today- XPS and WCUS

We are delighted to announce the launch of two new Research Technology Platforms (RTPs). The X-Ray Photoemission Spectroscopy (XPS RTP) and Warwick Centre for Ultrafast Spectroscopy (WCUS RTP) are the latest to join, taking the total to 12 RTPs formed since the programme’s inception in 2014. The RTPs provide researchers at Warwick, and externally, to access the state of art equipment and technical expertise to enable their world-class research.

More information on the XPS and WCUS RTPs can be found on the website, and in the RTP brochure. The RTPs provide an integrated network of world-class facilities and expertise that enable researchers to perform outstanding science. Any researcher at Warwick can get access to these technologies, which include electron microscopy, bioinformatics, polymer characterisation, scientific computing and much more!

Mon 02 Aug 2021, 09:29

Spectroscopy RTP New Equipment - A fluorescence spectrometer

The spectroscopy RTP is pleased to take delivery of a fluorescence spectrometer, a Edinburgh instruments FS5. The FS5 is a purpose built fully integrated spectrofluorometer capable excitation from >200 mn to 800 nm and detection of emission from 200 nm to 860 nm. The system can not only measure Steady State Fluorescence but also has an integrating sphere to enable quantum yield measurements and is capable of measuring Phosphorescence life time (>5 us to 10 s ). The system is capable of measuring liquids from -50 to 100 C and solids, powders, and films at room temperature although a -190 C solid samples is planned for the near future. We are hoping to be offering training on the system to new users soon but if you have samples ready the RTP staff are happy to run them for you. If you have any questions or wish to discuss and future experiment, please contact

Mon 29 Mar 2021, 09:00

Spectroscopy RTP New Equipment -A surface profiling microscope.

The Spectroscopy RTP is pleased to take delivery of a surface profiling microscope, a Filmetrics ProFilm 3D. The ProFilm 3D uses white light interferometry to measure surface profiles and roughness on samples upto 100 mm x 100 mm. Surface roughness of down to 0.01 micron are measurable by use of phase-shifting interferometry. Due to the current restrictions in access, the Spectroscopy RTP will, initially, be running the surface profiler on behalf of researchers via sample submission service. Acquired Data can be viewed and analysed on most desktops via ProfilmOnline a free web based app. If you have any questions or wish to discuss any future experiment, please contact

Wed 24 Mar 2021, 09:00

Older news